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In this chapter, electromigration is formulated as a phenomenon of mass transport in metals under an electrical current driving force within the framework of irreversible thermodynamics. Based on this approach, the solute effect on electromigration is analyzed by considering the correlation in atomic jumping processes, a problem that is of interest to understand how solute addition can affect electromigration in metals. This is followed by a review of the theory of the electromigration driving force and a discussion of the controversy of the electron screening effect. This chapter is concluded by reviewing the results on substitutional and interstitial electromigration in bulk metals.
This chapter first showed how electromigration for the on-chip interconnects is distinctly different from that of bulk metals. As the microelectronics technology rapidly advances following Moore’s law, electromigration becomes a key reliability problem for on-chip interconnects. This significantly changes the characteristics of electromigration, rendering thermal stresses as equally important in controlling mass transport and damage formation in the interconnects. This led to the discovery of the Blech short-length effect, establishing the concept of a critical current density-length (jLc) product as an important reliability criterion for on-chip interconnects. In this chapter, thermal stress characteristics and stress-induced void formation in passivated Al and Cu lines are investigated. The effect of dielectric confinement on thermal stress characteristics is discussed and verified by results of X-ray diffraction measurements of passivated Al and Cu lines. Then stress relaxation in passivated Al and Cu lines is discussed and correlated to stress-induced void formation.
This book offers a clear and interdisciplinary introduction to the structural and scattering properties of complex photonic media, focusing on deterministic aperiodic structures and their conceptual roots in geometry and number theory. It integrates important results and recent developments into a coherent and physically consistent story, balanced between mathematical designs, scattering and optical theories, and engineering device applications. The book includes discussions of emerging device applications in metamaterials and nano-optics technology. Both academia and industry will find the book of interest as it develops the underlying physical and mathematical background in partnership with engineering applications, providing a perspective on both fundamental optical sciences and photonic device technology. Emphasizing the comprehension of physical concepts and their engineering implications over the more formal developments, this is an essential introduction to the stimulating and fast-growing field of aperiodic optics and complex photonics.
Learn to assess electromigration reliability and design more resilient chips in this comprehensive and practical resource. Beginning with fundamental physics and building to advanced methodologies, this book enables the reader to develop highly reliable on-chip wiring stacks and power grids. Through a detailed review on the role of microstructure, interfaces and processing on electromigration reliability, as well as characterisation, testing and analysis, the book follows the development of on-chip interconnects from microscale to nanoscale. Practical modeling methodologies for statistical analysis, from simple 1D approximation to complex 3D description, can be used for step-by-step development of reliable on-chip wiring stacks and industrial-grade power/ground grids. This is an ideal resource for materials scientists and reliability and chip design engineers.
This comprehensive text provides an excellent introduction to the state of the art in the identification of network-connected systems. It covers models and methods in detail, includes a case study showing how many of these methods are applied in adaptive optics and addresses open research questions. Specific models covered include generic modelling for MIMO LTI systems, signal flow models of dynamic networks and models of networks of local LTI systems. A variety of different identification methods are discussed, including identification of signal flow dynamics networks, subspace-like identification of multi-dimensional systems and subspace identification of local systems in an NDS. Researchers working in system identification and/or networked systems will appreciate the comprehensive overview provided, and the emphasis on algorithm design will interest those wishing to test the theory on real-life applications. This is the ideal text for researchers and graduate students interested in system identification for networked systems.
Discover the ever-growing field of smart grid sensors, covering traditional and state-of-the-art sensor technologies, as well as data-driven and intelligent methods for using sensor measurements in support of innovative smart grid applications. Covers recent and emerging topics, such as smart meters, synchronized phasor measurements, and synchronized waveform measurements. Additional advanced topics and future trends are also discussed, such as situational awareness, probing, and working with off-domain measurements. Including real-world examples, exercise questions, and sample data sets, this is an essential text for students, researchers, and scientists, as well as field engineers and practitioners in the areas of smart grid and power systems.
This chapter is about measuring instantaneous power, active power, reactive power, power factor, and energy. We characterize different types of power system components based on their power profiles. Measuring energy is covered based on fixed intervals and fixed increments, as well as net energy metering and feed-in energy metering. We discuss smart meters and their applications in price-based and incentive-based demand response programs, as well as in baseline calculation in demand response applications. Other applications of smart meter measurements are covered, such as in load profiling and load classification. We discuss load disaggregation, net load disaggregation, and sub-metering, as well as static load modeling and dynamic load modeling. State estimation is also covered by using power measurements, including both nonlinear and linearized formulations. The following subjects are also discussed in this chapter: three-phase and unbalanced power measurements and their applications, accuracy in power and energy measurements, including different accuracy classes, meter accuracy versus system accuracy, as well as different factors that affect accuracy.
This chapter is about other types of smart grid sensors as well as off-domain measurements. Off-domain measurements are the kind of measurements that are not primarily intended for the power sector; yet they can help with certain smart grid applications. These additional data and measurements can be used as stand-alone data, or in cross examination with the measurements that were discussed in the previous chapters. Device and asset sensors may provide electrical, mechanical, and chemical measurements. They can be used to monitor transformers, capacitor banks, line conductors, wind turbines, solar panels, and batteries. Building sensors are also discussed, such as different types of occupancy sensors, temperature and illuminance sensors, and measurements related to electric vehicles. Applications of financial data, including pricing and billing data, and data from electricity markets are explored. We also discuss the applications of images, laser images, and drones in smart grid monitoring. Other types of off-domain measurements are also briefly mentioned, such as the weather data, the data from national lightning detection network, traffic data, and data from social media.