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Chapter 2 provides a detailed description of synchrotron radiation sources including both bending magnets and insertion devices (wigglers and undulators), describing key properties such as the time structure, polarisation, emittance and spectral brightness, and coherence. Key aspects of the constraints that define the source design and the resulting properties are presented. The chapter includes some comparison with free electron lasers and the associated radiation properties.
Chapter 8 introduces the use of synchrotron radiation for imaging and micro- and nano-analysis, a field that is of growing importance at modern synchrotron radiation facilities. The methods include transmission microscopy and tomography (using both hard and soft X-rays) and a range of methods providing spatially-resolved spectroscopic information based on photoemission, photoabsorption and X-rayfluorescence. Finally two very different methods based on X-ray diffraction are described, namely the very well-established method of X-ray diffraction topography, but the much more modern technique of coherent X-ray diffraction imaging for 'lens-less' imagingdown to the nanoscopic scale.
Chapter 7 is a short chapter describing some methods to investigate the vibrational structure of materialsusing infrared radiation and extremely high resolution inelastic X-ray scattering.
Chapter 6 describes a range of methods to determine different aspects of the electronic structure of materials. These include both core level photoemission (and the associated 'chemical' shifts) and valence band photoemission, notably including angle-resolved photoelectron spectroscopy (ARPES). The use of X-ray absorption near-edge structures (XANES) and the related technique of X-ray magnetic circular dicroism (XMCD) using circularly-polarised radiation is also described, as is the use of X-ray emission spectroscopy (XES) and resonant inelastic X-ray scattering (RIXS) and Compton scattering. Finally, the use of photoemission and photoionisation to investigate gas-phase molecular structure is described.
Chapter 5 describes techniques to determine the localstructure of materials both on an atomic and microscopic scale that do not rely on X-ray crystal diffraction. These include small angle scattering (SAXS) and wide angle scattering (WAXS), near-edge and extended X-ray absorption fine structure spectroscopy (XAFS, NEXAFS, EXAFS) but also photoelectron diffraction and X-ray fluorescence holography.
Learn about the properties of synchrotron radiation and its wide range of applications in physics, materials science and chemistry with this invaluable reference. This thorough text describes the physical principles of the subject, its source and methods of delivery to the sample, as well as the different techniques that use synchrotron radiation to analyse the electronic properties and structure of crystalline and non-crystalline materials and surfaces. Explains applications to study the structure and electronic properties of materials on a microscopic, nanoscopic and atomic scale. An excellent resource for current and future users of these facilities, showing how the available techniques can complement information obtained in users' home laboratories. Perfect for graduate and senior undergraduate students taking specialist courses in synchrotron radiation, in addition to new and established researchers in the field.