Hostname: page-component-cb9f654ff-mx8w7 Total loading time: 0 Render date: 2025-08-24T22:58:52.648Z Has data issue: false hasContentIssue false
  • English
  • Français

X-ray Fluorescence Analysis in Weed Science

Published online by Cambridge University Press:  12 June 2017

R. H. Falk ,
F. D. Hess  and
D. E. Bayer
R. H. Falk
Affiliation:
Bot. Dept., Univ. of California, Davis, CA 95616
F. D. Hess
Affiliation:
Bot. Dept., Univ. of California, Davis, CA 95616
D. E. Bayer
Affiliation:
Bot. Dept., Univ. of California, Davis, CA 95616
Get access Rights & Permissions [Opens in a new window]

Abstract

X-ray fluorescence analysis (XFA) is a new method for the spatial localization and quantification of herbicide residue on leaf surfaces. The distribution pattern of propanil (3′,4′-dichloropropionanilide) on the surface of prune (Prunus domestica L.) leaves sprayed to simulate drift is easily mapped using XFA. Residue distribution maps may be electronically enhanced. Enhancement does not qualitatively change the information content of the map when done with discretion.

Information

Type
Research Article
Information
Weed Science , Volume 23 , Issue 5 , September 1975 , pp. 373 - 377
Copyright
Copyright © 1975 by the Weed Science Society of America 

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

Article purchase

Temporarily unavailable

References

Literature Cited

1. Beaman, D.R. and Isasi, J.A. 1971. Electron beam microanalysis–Part 1. Materials Res. and Std. 11:8–78.Google Scholar
2. Bertin, Eugene P. 1970. Principles and Practices of X-ray Spectrometric Analysis. Plenum Press, New York. 679 pp.Google Scholar
3. Falk, R.H., Bayer, D.E., and Hess, F.D. 1974. Spatial relationships of pesticides on leaf surfaces. Proc. 7th Annual Scanning Electron Microscope symposium. Johari, O. and Corvin, I., eds., IIT Research Institute 7:429–436.Google Scholar
4. Falk, R.H., Hess, F.D., and Bayer, D.E. 1974. Quantitation using x-ray microanalysis. Weed Sci. Soc. of Amer. 208:90 (Abstr.) Google Scholar
5. Hess, F.D., Bayer, D.E., and Falk, R.H. 1974. Herbicide dispersal patterns: I. As a function of leaf surface. Weed Sci. 22:394–401.CrossRefGoogle Scholar
6. Jenkins, R. and de Vries, J.L. 1969. Practical X-ray Spectrometry. Springer-Verlag, New York. 190 pp.CrossRefGoogle Scholar
7. Ong, B.Y., Falk, R.H., and Bayer, D.E. 1973. Scanning electron microscope observations of herbicide dispersal using cathodoluminescence as the detection mode. Plant Physiol. 51:415–420.CrossRefGoogle ScholarPubMed
8. Russ, J.C. 1971. Energy Dispersion X-ray Analysis: X-ray and Electron Probe Analysis. ASTM Special Technical Publication 485. 284 pp.Google Scholar
9. Russ, J.C. 1974. X-ray microanalysis in the biological sciences. J. Submicro. Cytol. 6:55–79.Google Scholar
10. Woldseth, R. 1973. X-ray Energy Spectrometry. Kevex Corporation, Burlingame, California. 151 pp.Google Scholar