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Physico-chemical environment of Al impurity atomsin amorphous silica

Published online by Cambridge University Press:  29 November 2002

Ph. Jonnard ,
J.-P. Morreeuw  and
H. Bercegol
Ph. Jonnard*
Affiliation:
Laboratoire de Chimie Physique-Matière et Rayonnement, Université Pierre et Marie Curie, UMR-CNRS 7614, 11 rue Pierre et Marie Curie, 75231 Paris Cedex 05, France
J.-P. Morreeuw
Affiliation:
CEA/CESTA, BP 2, 33114 Le Barp, France
H. Bercegol
Affiliation:
CEA/CESTA, BP 2, 33114 Le Barp, France
*
jonnard@ccr.jussieu.fr
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Abstract

The physico-chemical environment around the aluminum impurity atomsin commercial Herasil silica is studied by electron-induced X-ray emissionspectroscopy. Despite the low concentration of aluminum and the charging effect occurring upon electron irradiation, we have been able to characterizethe environment of the Al atoms. We show that the Al atoms are in anoctahedral environment, i.e. surrounded by 6 oxygen atoms. The presenceof Al clusters, whose metallic character would make them candidates to beultraviolet absorption centers, is ruled out.

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Type
Research Article
Information
The European Physical Journal - Applied Physics , Volume 21 , Issue 2 , February 2003 , pp. 147 - 149
Copyright
© EDP Sciences, 2003

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References

André, M.L., Proc. SPIE 3578, 766 (1998) CrossRef
Solid State Lasers for Application to Inertial Confinement Fusion (ICF), edited by W.F. Krupke, Proc. SPIE 2633 (1995)
C. Bonnelle, Annual Report C, Royal Society of Chemistry, London, 1987, p. 201
Day, D.E., Nature 4907, 649 (1963) CrossRef
Bonnelle, C., Vergand, F., Jonnard, P., André, J.-M., Staub, P.-F., Avila, P., Chargelègue, P., Fontaine, M.-F., Laporte, D., Paquier, P., Ringuenet, A., Rodriguez, B., Rev. Sci. Instrum. 65, 3466 (1994) CrossRef
Staub, P.-F., X-ray Spectrom. 27, 43 (1998) 3.0.CO;2-N>CrossRef
Staub, P.-F., Jonnard, P., Vergand, F., Thirion, J., Bonnelle, C., X-ray Spectrom. 27, 58 (1998) 3.0.CO;2-4>CrossRef
Hombourger, C., Jonnard, P., Filatova, E.O., Lukyanov, V., Appl. Phys. Lett. 81, 2740 (2002) CrossRef
Kefi, M., Jonnard, P., Vergand, F., Bonnelle, C., Gillet, E., J. Phys.-Cond. Matter 5, 8629 (1993) CrossRef
Keen, D.A., Dove, M.T., J. Phys.-Cond. Matter 11, 9263 (1999) CrossRef