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Study of the arc dynamics by means of optical and magnetic measurements

Published online by Cambridge University Press:  01 October 2002

J. P. Toumazet ,
C. Brdys ,
E. Debellut  and
J. L. Ponthenier
J. P. Toumazet
Affiliation:
Laboratoire d'Électrotechnique de Montluçon, avenue Aristide Briand, 03100 Montluçon, France
C. Brdys*
Affiliation:
Laboratoire d'Électrotechnique de Montluçon, avenue Aristide Briand, 03100 Montluçon, France
E. Debellut
Affiliation:
Laboratoire d'Électrotechnique de Montluçon, avenue Aristide Briand, 03100 Montluçon, France
J. L. Ponthenier
Affiliation:
Groupe Schneider Electric, DBTT-EDT, usine S2E, 38050 Grenoble Cedex 9, France
*
Corinne.Brdys@moniut.univ-bpclermont.fr
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Abstract

The presented study concerns the dynamics of the arc in alow-voltage breaking device. For this study, two methods ofdiagnostics are used: a magnetic diagnostics based on punctualmeasurements of the induction and an optical diagnostics using ahigh-speed camera and a CCD camera. These two diagnostics arecompared for different experimental conditions.

Keywords

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Type
Research Article
Information
The European Physical Journal - Applied Physics , Volume 20 , Issue 1 , October 2002 , pp. 55 - 59
Copyright
© EDP Sciences, 2002

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References

Chevrier, P., Barrault, M., Fievet, C., Maftoul, J., Million Fremillon, J., J. Phys. D: Appl. Phys. 30, 1346 (1997)
Georghiou, G.E., Morrow, R., Metwas, A.C., J. Phys. D: Appl. Phys. 33, 2453 (2000) CrossRef
Guillaumond, F., Haug, R., Meas. Sci. Technol. 7, 1054 (1996) CrossRef
K. Suhara, 20th International Conference on Electrical Contacts, 2000, Stockholm, pp. 91-96
Brdys, C., Toumazet, J.P., Velleaud, G., Servant, S., IEEE Trans. Plasma Sci. 27, 595 (1999) CrossRef
Toumazet, J.P., Velleaud, G., Brdys, C., Servant, S., J. Phys. D: Appl. Phys. 32, 121 (1999) CrossRef
Fiévet, C., Barrault, M., Petit, P., Chevrier, P., Fleurier, C., André, V., J. Phys. D: Appl. Phys. 30, 2991 (1997) CrossRef
Hartinger, K.T., Pierre, L., Cahen, C., J. Phys. D: Appl. Phys. 31, 2566 (1998) CrossRef
Debellut, E., Gary, F., Cajal, D., Laurent, A., J. Phys. D: Appl. Phys. 34, 1665 (2001) CrossRef
Yotsombat, B., Davydov, S., Poolcharuansin, P., Vilaithong, T., Brown, I.G., J. Phys. D: Appl. Phys. 34, 1928 (2001) CrossRef