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Object size effect on the contact potential difference measured by scanning Kelvin probe method

Published online by Cambridge University Press:  07 July 2010

B. Polyakov ,
R. Krutokhvostov ,
A. Kuzmin ,
E. Tamanis ,
I. Muzikante  and
I. Tale
B. Polyakov*
Affiliation:
Institute of Solid State Physics, University of Latvia, Kengaraga st. 8, 1063 Riga, Latvia
R. Krutokhvostov
Affiliation:
Institute of Solid State Physics, University of Latvia, Kengaraga st. 8, 1063 Riga, Latvia
A. Kuzmin
Affiliation:
Institute of Solid State Physics, University of Latvia, Kengaraga st. 8, 1063 Riga, Latvia
E. Tamanis
Affiliation:
G. Liberta Innovative Microscopy Center, Daugavpils University, Parades street 1, 5401 Daugavpils, Latvia
I. Muzikante
Affiliation:
Institute of Solid State Physics, University of Latvia, Kengaraga st. 8, 1063 Riga, Latvia
I. Tale
Affiliation:
Institute of Solid State Physics, University of Latvia, Kengaraga st. 8, 1063 Riga, Latvia
*
boris.polyakov@cfi.lu.lv
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Abstract

Contact potential difference (CPD) was measured by macroscopic Kelvin probe instrument and scanning Kelvin probe microscope on Al, Ni and Pt on ITO substrates at ambient conditions. CPD values measured by scanning Kelvin probe microscope and macroscopic Kelvin probe are close within the error of about 10–30% for large studied objects, whereas scanning Kelvin probe microscope signal decreases, when the object size becomes smaller than 1.4 μm. CPD and electric field signals measured using many-pass technique allowed us to estimate the influence of electrostatic field disturbance, especially, in the case of small objects.

Information

Type
Research Article
Information
The European Physical Journal - Applied Physics , Volume 51 , Issue 2 , August 2010 , 21201
Copyright
© EDP Sciences, 2010

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