Hostname: page-component-cb9f654ff-c75p9 Total loading time: 0 Render date: 2025-08-24T10:24:04.148Z Has data issue: false hasContentIssue false

Definition of a simple resolution criterion in an Apertureless Scanning Near-Field OpticalMicroscope (A-SNOM): contribution of the tip vibration and lock-indetection

Published online by Cambridge University Press:  22 March 2004

J.-L. Bijeon*
Affiliation:
Laboratoire de Nanotechnologie et d'Instrumentation Optique, Université de Technologie de Troyes, 12 rue Marie Curie, BP 2060, 10010 Troyes Cedex, France
P.-M. Adam
Affiliation:
Laboratoire de Nanotechnologie et d'Instrumentation Optique, Université de Technologie de Troyes, 12 rue Marie Curie, BP 2060, 10010 Troyes Cedex, France
D. Barchiesi
Affiliation:
Laboratoire de Nanotechnologie et d'Instrumentation Optique, Université de Technologie de Troyes, 12 rue Marie Curie, BP 2060, 10010 Troyes Cedex, France
P. Royer
Affiliation:
Laboratoire de Nanotechnologie et d'Instrumentation Optique, Université de Technologie de Troyes, 12 rue Marie Curie, BP 2060, 10010 Troyes Cedex, France
Get access

Abstract

A realistic near-field calculation on metallic holesamples in illumination transmission conditions predicts certainlight confinements around the holes. The purpose of this paper isto explain theoretically how an A-SNOM (Apertureless ScanningNear-field Optical Microscope) is able to detect the lightconfinement around the holes, and how it is possible, by defininga criterion of separation between two holes in near-field, toanalyse the resolution as a function of the experimentalparameters. The modulation of the probe height in A-SNOM is usedfor both distance control and separation of the near-field fromthe background scattered light. A realistic model of lock-indetection is used to calculate the images of test samples.Constant height mode images are presented at different amplitudesof probe modulation and average heights of the tip. We alsodiscuss the detection at different demodulation harmonics.

Keywords

Information

Type
Research Article
Copyright
© EDP Sciences, 2004

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

Article purchase

Temporarily unavailable

References

Synge, E.H., Philos. Mag. 6, 356 (1928) CrossRef
Ash, E.A., Nicholls, G., Nature 237, 510 (1972) CrossRef
Pohl, D.W., Denk, W., Lanz, M., Appl. Phys. Lett. 44, 651 (1984) CrossRef
Zenhausern, F., Martin, Y., Wickramasinghe, H.K., Science 269, 1083 (1995) CrossRef
Bachelot, R., Gleyzes, P., Boccara, A.C., Opt. Lett. 20, 1924 (1995) CrossRef
Hamman, H.F., Gallagher, A., Nesbitt, D.J., Appl. Phys. Lett. 73, 1469 (1998) CrossRef
Adam, P.M., Royer, P., Laddada, R., Bijeon, J.-L., Appl. Opt. 37, 1814 (1998) CrossRef
R.J. Colton, A. Engel, J.E. Frommer, H.E. Graub, A.A. Gewirth, R. Guckenberger, J. Rabe, W.M. Heckl, B. Parkinson, Procedures in Scanning Probe Microscopies (John Wiley and Sons, 1998)
Martin, O.J.F., Girard, C., Appl. Phys. Lett. 70, 705 (1997) CrossRef
Madrazo, A., Carminati, R., Nieto-Vesperinas, M., Greffet, J.-J., J. Opt. Soc. Am. A 15, 109 (1998) CrossRef
Novotny, L., Sanchez, E.J., Xie, X.S., Ultramicroscopy 71, 21 (1998) CrossRef
Kawata, Y., Xu, C., Denk, W., J. Appl. Phys. 85, 1294 (1999) CrossRef
Martin, Y.C., Hamann, H.F., Wickramasinghe, H.K., J. Appl. Phys. 89, 5774 (2001) CrossRef
Wurtz, G., Bachelot, R., Royer, P., Eur. Phys. J. Appl. Phys. 5, 269 (1999) CrossRef
Hillenbrand, R., Keilmann, F., Phys. Rev. Lett. 85, 3029 (2000) CrossRef
Knoll, B., Keilmann, F., Opt. Commun. 182, 321 (2000) CrossRef
Labardi, M., Patanè, S., Allegrini, M., Appl. Phys. Lett. 77, 621 (2000) CrossRef
Adam, P.M., Bijeon, J.-L., Viardot, G., Royer, P., Opt. Commun. 174, 91 (2000) CrossRef
Walford, J.N., Porto, J.A., Carminati, R., Greffet, J.-J., Adam, P.M., Hudlet, S., Bijeon, J.-L., Stashkevich, A., Royer, P., J. Appl. Phys. 89, 5159 (2001) CrossRef
Maghelli, N., Labardi, M., Patanè, S., Irrera, F., Allegrini, M., J. Micros. 202, 84 (2001) CrossRef
Greffet, J.-J., Carminati, R., Prog. Surf. Sci. 56, 133 (1997) CrossRef
Bainier, C., Vannier, C., Courjon, D., Rivoal, J.-C., Ducourtieux, S., De Wilde, Y., Aigouy, L., Formanek, F., Belliard, L., Siry, P., Perrin, B., Appl. Opt. 42, 691 (2003) CrossRef
Van Labeke, D., Barchiesi, D., J. Opt. Soc. Am. A 10, 2193 (1993) CrossRef
Barchiesi, D., Opt. Commun. 126, 7 (1996) CrossRef
Agarwal, G.S., Phys. Rev. B 15, 2371 (1977) CrossRef
Sentenac, A., Greffet, J.-J., Ultramicroscopy 57, 246 (1995) CrossRef
Davy, S., Barchiesi, D., Spajer, M., Courjon, D., Eur. Phys. J. Appl. Phys. 5, 277 (1999) CrossRef
Vial, A., Barchiesi, D., Parent, G., J. Micros. 194, 265 (1999) CrossRef
Baida, F.I., Van Labeke, D., Vigoureux, J.M., Phys. Rev. B 60, 7812 (1999) CrossRef
D. Maystre, Rigorous vector theories of diffraction gratings, edited by E. Wolf (Elsevier, Amsterdam, 1984), Prog. Opt., Vol. XXI, Chap. I, pp. 1–67
Barchiesi, D., Girard, C., Martin, O.J.F., Van Labeke, D., Courjon, D., Phys. Rev. E 54, 4285 (1996) CrossRef
Tatarski, V.I., J. Opt. Soc. Am. A 14, 618 (1995)
Novotny, L., Pohl, D.W., Regli, P., J. Opt. Soc. Am. A 11, 1768 (1994) CrossRef