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S213 Characterization of Strained Silicon on Insulator (sSOI) Substrates Using High-Resolution X-ray Diffraction

Published online by Cambridge University Press:  20 May 2016

M. Wormington ,
T. Lafford  and
P. Ryan
M. Wormington
Affiliation:
Bede Scientific Inc., Centennial, CO
T. Lafford
Affiliation:
Bede plc, Durham, UK
P. Ryan
Affiliation:
Bede plc, Durham, UK
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Abstract

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Type
DENVER X-RAY CONFERENCE
Information
Powder Diffraction , Volume 23 , Issue 2 , June 2008 , pp. 185
Copyright
Copyright © Cambridge University Press 2008

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