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Powder X-ray diffraction and Rietveld analysis of Cd1−xCuxCr2O4(0.1≤x≤0.7)

Published online by Cambridge University Press:  01 March 2012

L. Q. Yan ,
Z. W. Jiang ,
X. D. Peng ,
L. H. He  and
F. W. Wang
L. Q. Yan
Affiliation:
Beijing National Laboratory for Condensed Matter Physics, Institute of Physics, Chinese Academy of Sciences, P.O. Box 603, Beijing, 100080, China
Z. W. Jiang
Affiliation:
Beijing National Laboratory for Condensed Matter Physics, Institute of Physics, Chinese Academy of Sciences, P.O. Box 603, Beijing, 100080, China
X. D. Peng
Affiliation:
Beijing National Laboratory for Condensed Matter Physics, Institute of Physics, Chinese Academy of Sciences, P.O. Box 603, Beijing, 100080, China
L. H. He
Affiliation:
Beijing National Laboratory for Condensed Matter Physics, Institute of Physics, Chinese Academy of Sciences, P.O. Box 603, Beijing, 100080, China
F. W. Wang
Affiliation:
Beijing National Laboratory for Condensed Matter Physics, Institute of Physics, Chinese Academy of Sciences, P.O. Box 603, Beijing, 100080, China
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Abstract

Structural properties of Cd1−xCuxCr2O4(CCCO) have been investigated by means of X-ray powder diffraction and Rietveld analysis. A structural phase transformation from Fd3m to I42d at x=0.64 has been detected. The lattice constant a of the cubic unit cell decreases rapidly with increasing Cu content up to x=0.62. At x=0.64, the cubic unit cell is compressed into a tetragonal cell and CrO6 octahedrons are distorted. With continuing Cu content increases above 0.64, the distortion of the unit cell is released slightly according to the changes in c/a. Magnetic properties of Cd1−xCuxCr2O4(x=0.1,0.3,0.5,0.7) have also been measured and are discussed.

Keywords

X-ray diffractionRietveld refinementCd1−xCuxCr2O4

Information

Type
Technical Articles
Information
Powder Diffraction , Volume 22 , Issue 4 , December 2007 , pp. 340 - 343
Copyright
Copyright © Cambridge University Press 2007

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