Hostname: page-component-cb9f654ff-lqqdg Total loading time: 0 Render date: 2025-08-26T05:54:39.283Z Has data issue: false hasContentIssue false
  • English
  • Français

In situ high-temperature X-ray diffraction study of phase transformations in silver behenate

Published online by Cambridge University Press:  01 March 2012

Thomas N. Blanton ,
Swavek Zdzieszynski ,
Michael Nicholas  and
Scott Misture
Thomas N. Blanton*
Affiliation:
Research & Development Laboratories, Eastman Kodak Company, Rochester, New York 14650
Swavek Zdzieszynski
Affiliation:
New York State College of Ceramics, Alfred University, Alfred, New York 14802
Michael Nicholas
Affiliation:
New York State College of Ceramics, Alfred University, Alfred, New York 14802
Scott Misture
Affiliation:
New York State College of Ceramics, Alfred University, Alfred, New York 14802
*
a)Electronic mail: Thomas.blanton@kodak.com
Get access Rights & Permissions [Opens in a new window]

Abstract

In situ high-temperature X-ray diffraction (XRD) data have been collected for silver behenate, CH3(CH2)20COOAg. In the absence of development chemistry silver behenate exhibits four phase transformations when heated from room temperature to 200°C. Combining XRD and differential scanning calorimetry (DSC) results, the phase transformation temperatures and phase types have been determined. Types I, II, and III forms of silver behenate are found to be crystalline phases, whereas Types IV and V forms are liquid crystal phases.

Information

Type
Read Hot X-Rays
Information
Powder Diffraction , Volume 20 , Issue 2 , June 2005 , pp. 94 - 96
Copyright
Copyright © Cambridge University Press 2005

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

Article purchase

Temporarily unavailable

References

Blanton, T. N., Huang, T. C., Toraya, H., Hubbard, C. R., Robie, S. B., Louer, D., Gobel, H. E., Will, G., Gilles, R., and Raftery, T., (1995). Powder Diffr. PODIE2 10, 91.Google Scholar
Cowdery-Corvan, P. J. and Whitcomb, D. R. (2002). Photothermographic and Thermographic Imaging Materials, Handbook of Imaging Materials, edited by Diamond, A. and Weiss, D. (Marcel Dekker, Inc., New York ).Google Scholar
Huang, T. C., Toraya, H., Blanton, T. N., and Wu, W. (1993). J. Appl. Crystallogr. JACGAR 10.1107/S0021889892009762 26, 180.CrossRefGoogle Scholar
Mastrangelo, J. C., Blanton, T. N., and Chen, S. H. (1995). Appl. Phys. Lett. APPLAB 10.1063/1.113170 66, 2212.CrossRefGoogle Scholar