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Improving energy stability in the National Institute of Standards and Technology Microcalorimeter X-ray detector

Published online by Cambridge University Press:  01 March 2012

Terrence Jach ,
John A. Small  and
Dale E. Newbury
Terrence Jach
Affiliation:
Surface and Microanalysis Science Division, National Institute of Standards and Technology, 100 Bureau Drive, Gaithersburg, Maryland 20899
John A. Small
Affiliation:
Surface and Microanalysis Science Division, National Institute of Standards and Technology, 100 Bureau Drive, Gaithersburg, Maryland 20899
Dale E. Newbury
Affiliation:
Surface and Microanalysis Science Division, National Institute of Standards and Technology, 100 Bureau Drive, Gaithersburg, Maryland 20899
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Abstract

Microcalorimeter X-ray detectors using a transition edge sensor depend for their linearity and energy scale on the stability of the operating point on the transition curve. We report on some sources of energy scale drift in microcalorimeter X-ray detectors and the manner in which they have been addressed. Previously observed drifts of >10 eV∕h have been reduced to 1–2 eV∕h. This improved stability has resulted in the observation of X-ray fluorescence linewidths of ⩽12 eV over 6 h of counting time.

Information

Type
XRD Instrumentation and Techniques
Information
Powder Diffraction , Volume 20 , Issue 2 , June 2005 , pp. 134 - 136
Copyright
Copyright © Cambridge University Press 2005

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References

McCammon, D., Cui, W., Juda, M., Plucinsky, P., Zhang, J., Kelley, R. L., Holt, S. S., Madejski, G. M., Moseley, S. H., and Szymkowiak, A. E. (1991). Nucl. Phys. A NUPABL 527, 821c.CrossRefGoogle Scholar
National Institute of Standards and Technology, Standard Reference Material 478.Google Scholar
Irwin, K. D., Hilton, G. C., Wollman, D. A., and Martinis, J. M. (1998). J. Appl. Phys. JAPIAU 10.1063/1.367153 83, 3978.CrossRefGoogle Scholar
Wollman, D. A., Irwin, K. D., Hilton, G. C., Dulcie, L. L., Newbury, D. E., and Martinis, J. M. (1997). J. Microsc. JMICAR 10.1046/j.1365-2818.1997.2670824.x 188, 196.CrossRefGoogle Scholar