Hostname: page-component-cb9f654ff-w5vf4 Total loading time: 0 Render date: 2025-08-24T15:37:08.746Z Has data issue: false hasContentIssue false
  • English
  • Français

Crystal Data for CuInTe2

Published online by Cambridge University Press:  10 January 2013

L. I. Haworth  and
R. D. Tomlinson
L. I. Haworth
Affiliation:
Department of Electronic and Electrical Engineering, University of Salford, U.K.
R. D. Tomlinson
Affiliation:
Department of Electronic and Electrical Engineering, University of Salford, U.K.
Get access Rights & Permissions [Opens in a new window]

Abstract

The Debye-Scherrer technique and filtered Cu Kα, radiation were used to obtain powder data for reflections to an angle of 2θ = 155°; a vertical scanning diffractometer was used to obtain intensity data to an angle of 2θ = 99°. The space group is with Z = 4. The lattice parameters of the tetragonal unit cell were measured to be a = 6.189 (1) Å and c = 12.391 (1) Å with c/a = 2.002 The unit cell volume was calculated as U = 474.6 (2) Å3 and the X-ray density as Dx = 6.07 ± 0.003 gm cm−3. By comparing measured and theoretical intensity values, the sublattice distortion parameter x was estimated to be x = 0.227 (12).

Information

Type
Research Article
Information
Powder Diffraction , Volume 3 , Issue 1 , March 1988 , pp. 43 - 46
Copyright
Copyright © Cambridge University Press 1988

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

Article purchase

Temporarily unavailable

References

Bodnar, I.V., Borisenko, T.E., Korzun, B.V. & Popelnyuk, G.P. (1984). Izv. Akad. Nauk SSSR, Neorg. Mater. 20, 1810–1813.Google Scholar
Brühl, H.G., Neumann, H., Pfeiffer, T., & Kühn, G. (1981). Phys. Stat. Solidi A, 597CrossRefGoogle Scholar
Goryonova, N.A. (1965). The Chemistry of Diamond-like Semiconductors. 140. Chapman & Hall: London.Google Scholar
Gržeta-Plenković, B. & Santić, B. (1983). J. Appl. Crystallogr. 16, 576.CrossRefGoogle Scholar
Hahn, H., Frank, T., Klinger, W., Meyer, A.D. & Störger, G. (1953). Z. Anorg. Allg. Chem. 271, 153–170.CrossRefGoogle Scholar
Haworth, L. (1986). PhD. Thesis, Univ. of Salford, England.Google Scholar
Haworth, L., Tomlinson, R. D. & Al-Saffar, I. S. (1980). Jpm. J. Appl. Phys. 19, Suppl. 19–3, 77–80.CrossRefGoogle Scholar
International Tables for X-ray Crystallography (1952). Vol. I. Kynoch Press: BirminghamGoogle Scholar
Nelson, J. B. & Riley, D.P. (1945). Proc. Phys. Soc. London 57, 160–171.CrossRefGoogle Scholar
Neumann, H. (1983). Cryst. Res. Technol. 18, 483.CrossRefGoogle Scholar
Neumann, H., Deus, P., Tomlinson, R.D., Kühn, G. & Hintze, B. (1984). Phys. Stat. Solidi A. 84, 87–93.CrossRefGoogle Scholar
Palatnik, L. S. & Rogacheva, E. I. (1966). Sov. Phys. Dokl. 12, 503–506.Google Scholar
Powder Diffraction File (1987). Swarthmore PA: International Centre for Diffraction Data, 1601 Park Lane, Swarthmore, PA 19081.Google Scholar
Tempel, A. & Schumann, B. (1979). Kris, und Tech. 14, 571–574.CrossRefGoogle Scholar
Thwaites, J. J., Tomlinson, R. D. & Hampshire, M. J. (1977). Solid State Commun. 23, 905–906.CrossRefGoogle Scholar
Tomlinson, R.D., Elliot, E., Haworth, L. & Hampshire, M.J. (1980). J. Cryst. Growth 49, 115–119.CrossRefGoogle Scholar