Hostname: page-component-5b777bbd6c-2c8nx Total loading time: 0 Render date: 2025-06-22T06:11:15.537Z Has data issue: false hasContentIssue false
  • English
  • Français

PULWIN: A program for analyzing powder X-ray diffraction patterns

Published online by Cambridge University Press:  10 January 2013

Sergio Brückner
Sergio Brückner*
Affiliation:
Dipartimento di Scienze e Tecnologìe Chimiche, via Cotonificio 108, I-33100 Udine, Italy
*
a)Electronic mail: sergio.bruckner@dstc.uniud.it
Get access Rights & Permissions [Opens in a new window]

Abstract

A computer program is presented that allows for the analysis of powder X-ray diffraction (XRD) patterns. Some peculiar features of the program are: the aptitude for dealing with diffractograms obtained from semicrystalline polymer samples and the ability to evaluate XRD patterns collected with CPS 120 detectors. The program is available as freeware via anonymous ftp at: ftp.cc.uniud.it under the directory/pulwin/.

Type
Technical Articles
Information
Powder Diffraction , Volume 15 , Issue 4 , December 2000 , pp. 218 - 219
Copyright
Copyright © Cambridge University Press 2000

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

Article purchase

Temporarily unavailable

References

Brückner, S. (2000).J. Appl. Crystallogr. 33, 977–979.CrossRefGoogle Scholar
Marquardt, D. W. (1963).J. Soc. Ind. Appl. Math. 11, 431–441.CrossRefGoogle Scholar
Press, W. H., Teukolsky, S. A., Vetterling, W. T., and Flannery, B. P. (1999). Numerical Recipes in C (Cambridge University Press, Cambridge), pp. 650–651.Google Scholar