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Cited by
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This article has been cited by the following publications. This list is generated based on data provided by Crossref.
Yao, J. Y. Andersson, T. G. and Dunlop, G. L. 1991. The interfacial morphology of strained epitaxial InxGa1−xAs/GaAs. Journal of Applied Physics, Vol. 69, Issue. 4, p. 2224.
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Yao, J Y Andersson, T G and Dunlop, G L 1994. Microstructures and critical thicknesses of InxGa1-xAs/GaAs strained-layer structures. Semiconductor Science and Technology, Vol. 9, Issue. 5, p. 1086.
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A Weak Beam Imaging Technique for the Characterization of Interfacial Roughness in (InGa)As/GaAs Strained Layer Structures
  • Volume 159
  • J. Y. Yao (a1), T. G. Andersson (a1) and G. L. Dunlop (a2)
  • DOI: https://doi.org/10.1557/PROC-159-345
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A Weak Beam Imaging Technique for the Characterization of Interfacial Roughness in (InGa)As/GaAs Strained Layer Structures
  • Volume 159
  • J. Y. Yao (a1), T. G. Andersson (a1) and G. L. Dunlop (a2)
  • DOI: https://doi.org/10.1557/PROC-159-345
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A Weak Beam Imaging Technique for the Characterization of Interfacial Roughness in (InGa)As/GaAs Strained Layer Structures
  • Volume 159
  • J. Y. Yao (a1), T. G. Andersson (a1) and G. L. Dunlop (a2)
  • DOI: https://doi.org/10.1557/PROC-159-345
Available formats Please select a format to save.
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