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Vacancy Supersaturation Model for Electromigration Failure Under DC and Pulsed DC Stress

Published online by Cambridge University Press:  15 February 2011

J. J. Clement
J. J. Clement*
Affiliation:
Digital Equipment Corp., 77 Reed Road, Hudson, MA 01749
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Abstract

Time-dependent vacancy concentration profiles are calculated numerically as solutions to the electromigration transport equation under dc and pulsed dc current stress conditions in finite-length conductors. An electromigration model based on the buildup of a critical vacancy supersaturation to initiate failure agrees well with several reported experimental observations.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 265: Symposium H – Materials Reliability in Microelectronics II , 1992 , 57
Copyright
Copyright © Materials Research Society 1992

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References

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