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Utilization of Charged Particle Backscattering to Study the Near Surface Region of Glasses. Application to Depth Profiling of Lanthanium, Cerium, Thorium and Uranium Induced by Aqueous Leaching.*

Published online by Cambridge University Press:  15 February 2011

Patrick Trocellier ,
Bernard Nens  and
Charles Engelmann
Patrick Trocellier
Affiliation:
Dèpartement de Chimie Appliquèe et d'Etudes Analytiques Service d'Etudes Analytiques - Section d'Etudes et d'Analyse Isotopique et Nuclèaire.CEN Saclay, 91191 Gif-Sur-Yvette Cèdex, France
Bernard Nens
Affiliation:
Dèpartement de Chimie Appliquèe et d'Etudes Analytiques Service d'Etudes Analytiques - Section d'Etudes et d'Analyse Isotopique et Nuclèaire.CEN Saclay, 91191 Gif-Sur-Yvette Cèdex, France
Charles Engelmann
Affiliation:
Dèpartement de Chimie Appliquèe et d'Etudes Analytiques Service d'Etudes Analytiques - Section d'Etudes et d'Analyse Isotopique et Nuclèaire.CEN Saclay, 91191 Gif-Sur-Yvette Cèdex, France
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Extract

The Rutherford backscattering technique is useful for the determination of the concentration profiles of some heavy elements in the near surface region of glasses, but is not able to provide chemical information on the elements detected.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 11: Symposium – Scientific Basis for Nuclear Waste Management V , 1981 , 193
Copyright
Copyright © Materials Research Society 1982

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Footnotes

*

Work performed under contract WAS 268-81-55 F with European Community Commission.

References

REFERENCES

1. ENGELMANN, CH. LOEUILLET, M. NENS, B. TROCELLIER, P. Silicates Industriels 2 (1981) 47 Google Scholar
2. ENGELMANN, CH. NENS, B. TROCELLIER, P. Verres Refract. 35 (1981) 486.Google Scholar