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U.S. DoD Applications of Ion Beam Processing

Published online by Cambridge University Press:  22 February 2011

James K. Hirvonen
James K. Hirvonen*
Affiliation:
Metals Research Branch, Materials Directorate U.S. Army Research Laboratory, Watertown, MA 02172-0001
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Abstract

Selected usages of ion beam processes within the U.S. Department of Defense (DoD) are discussed in terms of their technical merits, their current status, and the various factors governing their acceptance within the DoD user community.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 316: Symposium A – Materials Synthesis and Processing Using Ion Beams , 1993 , 533
Copyright
Copyright © Materials Research Society 1994

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References

REFERENCES

1 Dearnaley, G., Clinical Materials, 12, 237 (1993).Google Scholar
2 Culbertson, R., Burns, F.C., Franzen, W., Lowder, L.J., Ricca, J.J., and Gonzales, A., Nucl. Instr. and Meth. in Phys. Res., B56/57, 652 (1991).Google Scholar
3 Implant Sciences Corporation, Wakefield, MA. 01880-1246.Google Scholar
4 Singer, I.L., J. Vac. Sci. Technol., A1, 419 (1983).Google Scholar
5 Hartley, N.E.W. and Hirvonen, J.K., in Proc. 3rd Int. Conf. on Ion Beam Modification of Materials. (North Holland, Amsterdam, 1982), pp. 933–940.Google Scholar
6 Hubler, G.K., in Surface Alloying by Ion, Electron, and Laser Beams (ASM, Metals Park, OH, 1987), pp 287–324.Google Scholar
7 Brown, I.G., J. Vac. Sci. Technol. A 11, 1480 (1993) ; J.R. Treglio, G.D. Magnusson and R.J. Stinner, Surf. Coat. Technol., 51, 546 (1992).Google Scholar
8 Conrad, J.R., Mater. Science and Engineering, A116, 197–203 (1989).Google Scholar
9 Cuomo, J.J. and Rossnagel, S.M., Nucl. Instr. Methods, B 19/20, 963 (1978).Google Scholar
10 Mattox, D.M., J. Vac. Sci. Technol., A7, 1105 (1989).Google Scholar
11 Smidt, F.A., International Materials Reviews, 35 (2), 61–128 (1990).Google Scholar
12 Hirvonen, J.K., Mater. Sci. Reports, 6, 215 (1991).Google Scholar
13 Pawlewicz, W.T., Culver, T.R., Zachistal, J.H., Prevost, E.J., Traylor, J.D., and Wheeler, C.E., SPIE Proc. 1618, 1–16 (1991).Google Scholar
14 Donovan, E.P., van Vechten, D., Kahn, A.D.F., Carosella, C.A. and Hubler, G.K., Appl. Optics 28, 2940 (1989).Google Scholar
15 Donovan, E.P., Brighton, D.R., Hubler, G.K. and van Vechten, D., Nucl. Instr. Methods, B 19/20, 983 (1987).Google Scholar
16 Kant, R.A., Dillich, S.A., Sartwell, B.D. and Sprague, J.A., Mat. Res. Soc. Symp. Proc. 128, 165 (1989).Google Scholar
17 Barth, M., Ensinger, W., Schroer, A., and Wolf, G.K., in Surf. Modif.Technologies II. eds., Sudarshan, T.S. and Bhat, B.G., (TMS, Warrendale, 1990), p. 195.Google Scholar
18 Ensinger, W. and Wolf, G.K., Mat. Sci. and Eng., A116, 1–14 (1989).Google Scholar
19 Oguri, K. and Arai, T., J. Mater. Res., 7 (6), (1992).Google Scholar
20 Enke, K., Dimigen, H., and Huebsch, H., Appl. Phys. Lett., 36, 291–292 (1980).Google Scholar
21 Miyake, S., Sugitomo, I., and Kaneko, R., Proc. Jpn. Int. Tribology Conf., Oct. 1990, Nagoya, Japan, (Japanese Society of Tribologists, 1990), pp. 25–30.Google Scholar
22 Goode, P.D., Hughes, W. and Proctor, G.W., “Ion beam carbon layers”, U.K. Patent No. GB2122224 B (1986).Google Scholar
23 Carosella, C.A., NRL (private communication).Google Scholar
24 Jones, A.M., Bedell, C.J., Dearnaley, G. and Johnston, C., Proc. on Diamond and Diamond-like Carbon Films, Nice, Sept. 1991.Google Scholar
25 Hioki, T., Itoh, Y., Hibi, S. and Kawamoto, , 8th International Conference on Thin Films, April 2-6, 1990, San Diego, CA.Google Scholar
26 Fountzoulas, C.G., Demaree, J.D., Kosik, W.E., Franzen, W., Croft, W. and Hirvonen, J.K., Fall 1992 MRS Mtng., Symp. A, Boston, MA.Google Scholar
27 Bubenzer, A.,Discher, B., Brandt, G. and Koidl, P., J. Appl. Phys., 54 (8), 4590–4595(1983).Google Scholar
28 Bedell, C.J., Jones, A.M., and Dearnaley, G., Proc. 1st Int. Conf. on Applications of Diamond Films & Related Materials (Elsevier, The Netherlands, 1991) p. 827.Google Scholar
29 Middleton, R.M., Huang, P.J., Wells, M.G.H. and Kant, R.A., ARL-TR-40, ARL Materials Directorate, Watertown, MA, Dec. 1992.Google Scholar
30 Middleton, R.M., Huang, P.J., Wells, M.G.H. and Kant, R.A., Surface Engineering, 7 (7), 319(1991).Google Scholar
31 Middleton, R.M. et al. , ARL, MTD, to be published.Google Scholar
32 Ensinger, W., Schroer, A., and Wolf, G.K., in Surface and Coatings Technology. 51, 217–221 (1992).Google Scholar
33 Smidt, F.A. and Sartwell, B.D., Nucl. Instrum. & Methods in Phys. Research, B6, 70(1985).Google Scholar
34 Spire Corporation, Bedford, MA 01730.Google Scholar
35 Ng, L. and Naerheim, Y., in Price, R. (ed), Bearing Conf. Proc., Orlando, FL, March 10-12. 1987, (CSD Laboratories, Cambridge, MA, 1987) p. 1.Google Scholar
36 Concurrent Technologies Inc., Johnstown, PA.Google Scholar