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Katiyar, Rajesh K. Sharma, Yogesh Barrionuevo Diestra, Danilo G. Misra, Pankaj Kooriyattil, Sudheendran Pavunny, Shojan P. Morell, Gerardo Weiner, Brad R. Scott, J. F. and Katiyar, Ram S. 2015. Unipolar resistive switching in planar Pt/BiFeO3/Pt structure. AIP Advances, Vol. 5, Issue. 3,
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Niu, Gang Cartoixà, Xavier Grossi, Alessandro Zambelli, Cristian Olivo, Piero Perez, Eduardo Schubert, Markus Andreas Zaumseil, Peter Costina, Ioan Schroeder, Thomas and Wenger, Christian 2017. Mechanism of the Key Impact of Residual Carbon Content on the Reliability of Integrated Resistive Random Access Memory Arrays. The Journal of Physical Chemistry C, Vol. 121, Issue. 12, p. 7005.
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Unipolar Resistive Switching and Associated Photoresponse in Sm doped BiFeO3 Thin Film Grown by RF Sputtering
  • Volume 1577
  • Rajesh K. Katiyar (a1), Pankaj Misra (a1), G. L Sharma (a1), Gerardo Morell (a1), J. F Scott (a1) (a2) and Ram S. Katiyar (a1)
  • DOI: https://doi.org/10.1557/opl.2013.702
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Unipolar Resistive Switching and Associated Photoresponse in Sm doped BiFeO3 Thin Film Grown by RF Sputtering
  • Volume 1577
  • Rajesh K. Katiyar (a1), Pankaj Misra (a1), G. L Sharma (a1), Gerardo Morell (a1), J. F Scott (a1) (a2) and Ram S. Katiyar (a1)
  • DOI: https://doi.org/10.1557/opl.2013.702
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Unipolar Resistive Switching and Associated Photoresponse in Sm doped BiFeO3 Thin Film Grown by RF Sputtering
  • Volume 1577
  • Rajesh K. Katiyar (a1), Pankaj Misra (a1), G. L Sharma (a1), Gerardo Morell (a1), J. F Scott (a1) (a2) and Ram S. Katiyar (a1)
  • DOI: https://doi.org/10.1557/opl.2013.702
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