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Uniaxial magnetic anisotropy induced by vicinal surfaces in half metallic La0.7Sr0.3MnO3 thin films

Published online by Cambridge University Press:  31 January 2011

Paolo Perna ,
Erika Jiménez ,
Francisco J. Terán ,
Laurence Méchin ,
Julio Camarero  and
Rodolfo Miranda
Paolo Perna
Affiliation:
paolo.perna@imdea.org, Instituto Madrileño de Estudios Avanzados en Nanociencia IMDEA-Nanociencia, Madrid, Spain
Erika Jiménez
Affiliation:
paolo.perna@imdea.org, Instituto Madrileño de Estudios Avanzados en Nanociencia IMDEA-Nanociencia, Madrid, Spain
Francisco J. Terán
Affiliation:
paolo.perna@imdea.org, Instituto Madrileño de Estudios Avanzados en Nanociencia IMDEA-Nanociencia, Madrid, Spain
Laurence Méchin
Affiliation:
paolo.perna@imdea.org, Instituto Madrileño de Estudios Avanzados en Nanociencia IMDEA-Nanociencia, Madrid, Spain
Julio Camarero
Affiliation:
paolo.perna@imdea.org, Instituto Madrileño de Estudios Avanzados en Nanociencia IMDEA-Nanociencia, Madrid, Spain
Rodolfo Miranda
Affiliation:
paolo.perna@imdea.org, Instituto Madrileño de Estudios Avanzados en Nanociencia IMDEA-Nanociencia, Madrid, Spain
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Abstract

We present a detailed study of the angular dependence of the magnetization reversal at room temperature of well characterized epitaxial La0.7Sr0.3MnO3 (001) thin films grown onto SrTiO3 (001) vicinal substrates. The step edges at the substrate surface promote a topological modulation of the films along the step direction, breaking the four-fold magneto crystalline symmetry and favoring a two-fold magnetic anisotropy term. The competition between the biaxial and uniaxial anisotropy is depicted within the framework of the current theory, resulting in a vanishing biaxial contribution. The films hence show the magnetization easy (hard) direction parallel (perpendicular) to the steps direction. The thickness-dependent of both anisotropy and magnetization reversal are discussed in terms of topographic changes.

Keywords

oxidemagnetic propertiesmorphology
Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 1198: Symposium E – Advanced Materials for Half-Metallic and Organic Spintronics , 2009 , 1198-E01-04
Copyright
Copyright © Materials Research Society 2010

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References

1 Ruotolo, A., Oropallo, A., Granozio, F. Miletto, Pepe, G.P., Perna, P., Uccio, U. Scotti di, and Pullini, D., Appl. Phys. Lett. 91, 132502 (2007)Google Scholar
2 Radovic, M., Lampis, N., Granozio, F. Miletto, Perna, P., Ristic, Z., Salluzzo, M., Schleputz, C. M., and Uccio, U. Scotti di, Appl. Phys. Lett. 94, 022901 (2009)Google Scholar
3 Ruotolo, A., Oropallo, A., Granozio, F. Miletto Perna, P. and Uccio, U. Scotti di, Appl. Phys. Lett. 88, 252504 (2006)Google Scholar
4 Tsui, F., Smoak, M.C., Nath, T.K., Eom, C.B., Appl. Phys. Lett. 76, 17 2421 (2000)Google Scholar
5 Ecija, D., Jiménez, E., Mikuszeit, N., Sacristán, N. Camarero, J. Gallego, J. M., Vogel, J. and Miranda, R., Phys. Rev. B 77, 024426 (2008)Google Scholar
6 Bowen, M., Bibes, M., Barthelemy, A., Contour, J.-P., Anane, A., Lemaitre, Y. and Fert, A., Appl. Phys. Lett. 82(2), 233 (2003)Google Scholar
7 Steenbeck, K., Hiergeist, R., Appl. Phys. Lett. 75(12), 1778 (1999)Google Scholar
8 Lecoeur, P., Trouilloud, P.L., Xiao, G., Gupta, A., Gong, G.Q., Li, X.W., J. Appl. Phys. 82(8), 3934 Google Scholar
9 , Suzuki, Hwang, H.Y., Cheong, S-W., Dover, R.B.van, Appl. Phys. Lett. 71, (1) 140 (1997)Google Scholar
10 Berndt, L.M., Balbarin, V., Suzuki, Y., Appl. Phys. Lett. 77(18), 2903 (2000)Google Scholar
11 Mathews, M., Postma, F. M., Lodder, J. C., Jansen, R., Rijnders, G., and Blank, D. H., Appl. Phys. Lett. 87, 242507 (2005)Google Scholar
12 Habermeier, H.-U., J. Electrochem. 13, 23 (2004)Google Scholar
13 Hyman, R.A., Zangwill, A., Stiles, M.D., Phys. Rev. B 58(14), 9276 (1998)Google Scholar
14 Wang, Z.-H., Cristiani, G., Habermeier, H.-U., Appl. Phys. Lett. 82(21), 3731 (2003)Google Scholar
15 Perna, P., Méchin, L., Chauvat, M.P., Ruterana, P., Simon, Ch., and Uccio, U. Scotti di, J. Phys.: Condens. Matter 21, 306005 (2009)Google Scholar
16 Camarero, J., Sort, J., Hoffmann, A., García-Martín, J. M., Dieny, B., Miranda, R., and Nogués, J., Phys. Rev. Lett. 95, 057204 (2005)Google Scholar