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Toward Realizing the Structure-Property Link in Polycrystalline Thin Films

Published online by Cambridge University Press:  15 February 2011

C. S. Nichols
C. S. Nichols*
Affiliation:
Department of Materials Science & Engineering, Cornell University, Ithaca, NY
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Abstract

Many materials for engineering applications are used in polycrystalline form and contain grain boundaries with a range of structures and properties. However, most research on grain boundaries to date has focussed exclusively on symmetric coincidence site lattice interfaces. To go beyond descriptions for these simple interfaces and thence to an aggregate of grains and grain boundaries in a polycrystal will require a new approach. Here we discuss two models for properties of polycrystalline materials, including their advantages and drawbacks, and indicate the microstructural variables available to optimize properties.

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References

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