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Thermoelectric Measurements of Ni Nanojunctions

Published online by Cambridge University Press:  08 March 2013

See Kei Lee ,
Ryo Yamada  and
Hirokazu Tada
See Kei Lee
Affiliation:
Graduate School of Engineering Science, Osaka University, Toyonaka, Osaka, Japan.
Ryo Yamada
Affiliation:
Graduate School of Engineering Science, Osaka University, Toyonaka, Osaka, Japan.
Hirokazu Tada
Affiliation:
Graduate School of Engineering Science, Osaka University, Toyonaka, Osaka, Japan.
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Abstract

We investigated the thermoelectric voltage (TEV) of atomic contacts of nickel (Ni) by using a scanning tunneling microscope. The TEV of nanoscale junctions show fluctuation in stepwise manner. Histogram analysis of TEV observed in the Ni point contact with the conductance of 1.2 G 0 (G 0 = 2e 2/h is the quantum of charge conductance) revealed multiple voltage peaks at larger and smaller values observed at conductance of 2.5 G 0, which showed a single sharp voltage peak. Fluctuation observed in our results suggest that there is transition of the transport channel distribution caused by the thermal motion of Ni atoms.

Keywords

thermoelectricnanoscalenanostructure

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References

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