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Techniques for assessing the performance of circuit materials at microwave and millimetre-wave frequencies

Published online by Cambridge University Press:  01 February 2011

Charles E Free
Charles E Free*
Affiliation:
Advanced Technology Institute, University of Surrey, Guildford, Surrey GU2 7XH, UK
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Abstract

This paper discusses the techniques that are available for characterising circuit materials at microwave and millimetre wave frequencies. In particular, the paper focuses on a new technique for measuring the loss tangent of substrates at mm-wave frequencies using a circular resonant cavity. The benefits of the new technique are that it is simple, low cost, capable of good accuracy and has the potential to work at high mm-wave frequencies.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 783: Symposium B – Materials, Intergration, and Packaging Issues for High-Frequency Devices , 2003 , B1.7
Copyright
Copyright © Materials Research Society 2004

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References

REFERENCES

1. Free, C., Tian, Z., Barnwell, P. ‘Substrate Characterization: Simulation and Measurement at High Microwave Frequencies’ Proc. 33rd Int Symposium on Microelectronics, Boston, Sept. 20–22, 2000, pp 57–61 Google Scholar
2. Free, C., Tian, Z. ‘The Measurement and Practical Significance of Complex Permittivity at mm-wave Frequencies’ Proc 2003 Ceramic Interconnect Conference, Denver, April 7–9, 2003, pp95–100 Google Scholar