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The Synthesis of Polycrystalline Chalcopyrite Semiconductors by Microwave Irradiation

Published online by Cambridge University Press:  22 February 2011

Christopher C. Landry  and
Andrew R. Barron
Christopher C. Landry
Affiliation:
Department of Chemistry, Harvard University, 12 Oxford Street, Cambridge, MA 02138
Andrew R. Barron*
Affiliation:
Department of Chemistry, Harvard University, 12 Oxford Street, Cambridge, MA 02138
*
To whom correspondence should be addressed.
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Abstract

Polycrystalline samples of the chalcopyrites CuInS2, CuInSe2, AgInS2, and AgInSe2 have been prepared from stoichiometric mixtures of the pure elements using microwave irradiation. The reactions were performed in sealed quartz tubes in as few as three minutes. The products were analyzed by X-ray diffraction (XRD), scanning electron microscopy (SEM), energy dispersive X-ray (EDX) analysis, and X-ray photoelectron spectroscopy (XPS). The surface morphology and shape of the particles produced by this method suggests that the products are formed from liquid melts.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 327: Symposium N – Covalent Ceramics II: Non-Oxides , 1993 , 89
Copyright
Copyright © Materials Research Society 1994

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References

1. Madelung, O, Ed., Semiconductors, other than Group IV Elements and III- V Compounds. (Springer-Verlag, New York, 1992).Google Scholar
2. Woodyard, J. and Landis, G.A., Solar Cells 31, 297 (1991).Google Scholar
3. Guy, A.G., Introduction to Materials Science (McGraw-Hill, Marietta, OH, 1972).Google Scholar
4. Baghurst, D.R. and Mingos, D.M.P., J. Chem. Soc., Chem. Commun. 674 (1992).Google Scholar
5. Mingos, D.M.P. and Baghurst, D.R., Chem. Soc. Rev. 20,1 (1991).Google Scholar
6. Whittaker, A.G. and Mingos, D.M.P., J. Chem. Soc., Dalton Trans. 2751 (1992).Google Scholar
7. Joint Committee on Powder Diffraction Standards, Diffraction Data File (1992).Google Scholar
8. Hahn, H., Frank, G., Klingler, W., Meyer, A., Stager, G., Anorg, Z.. Aug. Chem. 271, 153 (1953).Google Scholar
9. Cambi, L. and Elli, M., Chem. Ind. 50,94 (1968).Google Scholar
10. Sui, D., Nagpal, K., and Ghandha, G., J. Appl. Crystallogr. 22,578 (1989)Google Scholar
11. Briggs, D. and Seah, M.P., Eds. Practical Surface Analysis (Wiley, New York, 1990), vol. 1.Google Scholar
12. Cahen, D., Ireland, P.J., Kazmerski, L.L., Thiel, F.A., J. Appl. Phys. 57, 4761 (1985).Google Scholar