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Structure of Au-Al2O3 Granular Metal Films

Published online by Cambridge University Press:  21 February 2011

B. Abeles ,
Q. Zhang ,
H. H. Hung ,
K. S. Liang ,
H. Ohtani ,
S. K. Behal ,
M. M. Disko ,
W. A. Lanford ,
M. Gadenne  and
P. Gadenne
B. Abeles
Affiliation:
Exxon Research and Engineering Company, Route 22 East, Annandale, NJ 08801
Q. Zhang
Affiliation:
Exxon Research and Engineering Company, Route 22 East, Annandale, NJ 08801
H. H. Hung
Affiliation:
Exxon Research and Engineering Company, Route 22 East, Annandale, NJ 08801
K. S. Liang
Affiliation:
Exxon Research and Engineering Company, Route 22 East, Annandale, NJ 08801
H. Ohtani
Affiliation:
Exxon Research and Engineering Company, Route 22 East, Annandale, NJ 08801
S. K. Behal
Affiliation:
Exxon Research and Engineering Company, Route 22 East, Annandale, NJ 08801
M. M. Disko
Affiliation:
Exxon Research and Engineering Company, Route 22 East, Annandale, NJ 08801
W. A. Lanford
Affiliation:
State University of New York, Albany, NY 12246
M. Gadenne
Affiliation:
Universite Pierre et Marie Curie, 4 Place Jussieu, 75252 Paris, Cedex 05, France
P. Gadenne
Affiliation:
Universite Pierre et Marie Curie, 4 Place Jussieu, 75252 Paris, Cedex 05, France
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Abstract

We have investigated the structural properties of sputter deposited granular AU-Al2O3 films. The films exhibit an abrupt percolation transition from insulating to metallic behavior at the composition of xc-40 vol.% Au. STM measurements yield images of individual grains and clusters of grains consistent with the TEM images. The surface roughness increases abruptly from 30Å to 50Å as the Au concentration increases from 35 to 45 vol.%. The roughening of the films in the metallic regime is consistent with behavior of the X-ray reflectivity.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 237: Symposium Ca – Interface Dynamics and Growth , 1991 , 171
Copyright
Copyright © Materials Research Society 1992

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References

REFERENCES

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