No CrossRef data available.
Published online by Cambridge University Press: 10 February 2011
The structure of c-axis oriented [YBa2Cu3O7−(YBCO) N / PrBa2Cu3O7 (PBCO)M/1000Å superlattices with N ranging between 1 and 12 and M=5 unit cells, grown by high oxygen pressure sputtering on (100) SrTiO3 substrates, is analyzed by x-ray diffraction (XRD) and highresolution transmission electron microscopy (HREM). The XRD spectra refinement shows epitaxial strain for YBCO thickness below 4 unit cells. For larger YBCO layer thickness, stress relaxes and step disorder builds up. HREM observations show sharp and flat interfaces between substrate and superlattice stack. The only observable defects are isolated steps or a-axis oriented domains in relaxed samples. The results of both structural tools are compared.