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Relationship Between Interfacial Strain and the Elastic Response of Multilayer Metal Film

Published online by Cambridge University Press:  22 February 2011

Bruce M. Clemens  and
Gary L. Eesley
Bruce M. Clemens
Affiliation:
Physics Department, General Motors Research Laboratories, Warren, Michigan 48090-9055.
Gary L. Eesley
Affiliation:
Physics Department, General Motors Research Laboratories, Warren, Michigan 48090-9055.
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Abstract

We have used x-ray diffraction and picosecond transient piezoreflectance to investigate the structural and elastic properties of three distinct multilayer systems: Mo/Ni, Pt/Ni and Ti/Ni. We demonstrate that the commonly observed lattice expansion perpendicular to the film plane is not a bulk effect, but is localized at the interface between the contacting metals. Incorporating the measured interfacial expansion into a universal binding relation, we show that the measured elastic softening versus compositional repeat distance can result from the interfacial strain.

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Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 130: Symposium C – Thin Films: Stresses and Mechanical Properties I , 1988 , 307
Copyright
Copyright © Materials Research Society 1989

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