Published online by Cambridge University Press: 15 February 2011
Experimental results obtained by rapid isothermal annealing of Si implanted semi-insulating GaAs are presented and compared with results obtained by electron-beam and conventional furnace annealing. We shall show that for high Cr-doped material the problem of redistribution cannot be avoided and that for undoped material, this technique yields very good activation (near 100%) and high mobility (approximately 4400 cm2 /V.sec).
Present address: Santa Rosa Technology Ctr., Hewlett-Packard, Santa Rosa, CA