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Radiation Detection with Evaporated Csl(TI) Coupled to a-Si:H Photodiode Layers

Published online by Cambridge University Press:  21 February 2011

I. Fujieda ,
G. Cho ,
J. Drewery ,
T. Gee ,
T. Jing ,
S. N. Kaplan ,
V. Perez-Mendez  and
D. Wildermuth
I. Fujieda
Affiliation:
Xerox Palo Alto Research Center, 3333 Coyote Hill Rd., Palo Alto, CA 94304
G. Cho
Affiliation:
Lawrence Berkeley Laboratory, 1 Cyclotron Rd, Berkeley, CA 94720
J. Drewery
Affiliation:
Lawrence Berkeley Laboratory, 1 Cyclotron Rd, Berkeley, CA 94720
T. Gee
Affiliation:
Lawrence Berkeley Laboratory, 1 Cyclotron Rd, Berkeley, CA 94720
T. Jing
Affiliation:
Lawrence Berkeley Laboratory, 1 Cyclotron Rd, Berkeley, CA 94720
S. N. Kaplan
Affiliation:
Lawrence Berkeley Laboratory, 1 Cyclotron Rd, Berkeley, CA 94720
V. Perez-Mendez
Affiliation:
Lawrence Berkeley Laboratory, 1 Cyclotron Rd, Berkeley, CA 94720
D. Wildermuth
Affiliation:
Lawrence Berkeley Laboratory, 1 Cyclotron Rd, Berkeley, CA 94720
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Abstract

Csl(TI) layers 100–1000 μm thick were evaporated on glass substrates from a crystal Csl(TI). When they were exposed to calibrated X-ray pulses, their scintillation properties were found to be comparable to those of a crystal Csl(TI). Single p particles from radioisotopes were successfully detected by these layers coupled to a crystalline Si photodiode. The light spread inside evaporated Csl(TI) was measured by an amorphous Si (a-Si:H) photodiode array coupled to evaporated Csl(TI) layers. Monolithic X-ray detectors were fabricated by evaporating Csl(TI) on a-Si:H photodiodes directly. The signal yield and noise of this prototype were 1.5×10+4 electrons/MeV and 3×10+4 electrons FWHM, respectively. Larger signal size and lower noise are expected by optimizing the photodiode design.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 219: Symposium A – Amorphous Silicon Technology - 1991 , 1991 , 191
Copyright
Copyright © Materials Research Society 1991

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References

REFERENCES

1. Perez-Mendez, V., Cho, G., Fujieda, I., Kaplan, S. N., Qureshi, S. and Street, R. A., MRS Symp. Proc. 149, 621 (1989), and references therein.CrossRefGoogle Scholar
2. Fujieda, I., Cho, G., Kaplan, S. N., Perez-Mendez, V., Qureshi, S. and Street, R. A., J. Non-Crystalline Solids. 115, 174 (1989).CrossRefGoogle Scholar
3. Equer, B. and Karar, A., Nucl. Instr. and Meth. A271, 574 (1988).Google Scholar
4. Pochet, T., Dubeau, J., Hamel, L.A., Equer, B. and Karar, A., MRS Symp. Proc. 149, 661 (1989).Google Scholar
5. Guang-Pu, Wei, Okamoto, H. and Hamakawa, Y., Jpn. J. Appl. Phys. 24, 1105 (1985).CrossRefGoogle Scholar
6. Mochiki, K., Hasegawa, K. and Namatame, S., Nucl. Instr. and Meth. A273, 640 (1988).CrossRefGoogle Scholar
7. Ito, H., Matsubara, S., Takahashi, T., Shimada, T. and Takeuchi, H., Jpn. J. Appl. Phys. 28, L1476 (1989).Google Scholar
8. Street, R.A., Nelson, S., Antonuk, L. and Perez-Mendez, V., MRS Symp. Proc. 192, 441 (1990).Google Scholar
9. Antonuk, L.E., Yorkston, J., Boudry, J., Longo, M.J., Jimenez, J. and Street, R.A., IEEE Trans. Nucl. Sci, NS-37, 165 (1990).Google Scholar
10. Holl, I., Lorenz, E. and Mageras, G., IEEE Trans. Nucl. Sci. NS-35, 105 (1988).Google Scholar
11. Kubota, S., Sakuragi, S., Hashimoto, S. and Ruan, J., Nucl. Instr. and Meth. A268, 275 (1988).Google Scholar
12. Bates, C.W., Electrons and Protons, Adv. Electron Physics, 28A, 451 (1968).Google Scholar
13. Stevels, A.L.N. and Schrama de Pauw, A.D.M., Philips Res. Repts 29, 340 (1974).Google Scholar
14. Fujieda, I., Cho, G., Kaplan, S. N., Perez-Mendez, V., Qureshi, S., Ward, W. and Street, R. A., MRS Symp. Proc. 118, 469 (1988).Google Scholar
15. Fujieda, I., Cho, G., Drewery, J., Gee, T., Jing, T., Kaplan, S. N., Perez-Mendez, V., Wildermuth, D. and Street, R. A., to be published in IEEE Trans. Nuc. Sci. NS–38 (1991).Google Scholar
16. Schotanus, P., Kamermans, R. and Dorebos, P., IEEE Trans. Nucl. Sci, NS–37, 177 (1990).Google Scholar
17. Giauque, R.D., Goulding, F.S., Jaklevic, J.M. and Pehl, R.H., Analytical Chemistry, 45 671 (1973).Google Scholar
18. Berger, M.J., Seltzer, S.M., Chappell, S.E., Humphreys, J.C. and Mots, J.W., Nucl. Instr. and Meth. 69, 181 (1969).Google Scholar
19. Jing, T., Drewery, J., Fujieda, I., Gee, T. and Perez-Mendez, V., abstract submitted to IEEE Nuclear Science Symposium (Nov.5–8, 1991).Google Scholar
20. Cho, G., Drewery, J.S., Fujieda, I., Jing, T., Kaplan, S. N., Perez-Mendez, V., Qureshi, S. and Street, R. A., MRS Symp. Proc. 192, 393 (1990).Google Scholar
21. Weisfield, R.L. and Tsai, C.C., MRS Symp. Proc. 192, 423 (1990).Google Scholar