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Quantitative Contact Spectroscopy and Imaging by Atomic-Force Acoustic Microscopy

Published online by Cambridge University Press:  10 February 2011

W. Arnold ,
S. Amelio ,
S. Hirsekorn  and
U. Rabe
W. Arnold
Affiliation:
Fraunhofer-Institute for Nondestructive Testing (IZFP), Bldg. 37, University, D-66123 Saarbrficken, Germany (arnold@izfp.fhg.de)
S. Amelio
Affiliation:
Fraunhofer-Institute for Nondestructive Testing (IZFP), Bldg. 37, University, D-66123 Saarbrficken, Germany (arnold@izfp.fhg.de)
S. Hirsekorn
Affiliation:
Fraunhofer-Institute for Nondestructive Testing (IZFP), Bldg. 37, University, D-66123 Saarbrficken, Germany (arnold@izfp.fhg.de)
U. Rabe
Affiliation:
Fraunhofer-Institute for Nondestructive Testing (IZFP), Bldg. 37, University, D-66123 Saarbrficken, Germany (arnold@izfp.fhg.de)
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Abstract

Atomic Force Acoustic Microscopy is a near-field technique which combines the ability in using ultrasonics to image elastic properties with the high lateral resolution of scanning probe microscopes. We present a technique to measure the contact stiffness and the Young's modulus of sample surfaces quantitatively with a resolution of approximately 20 rum exploiting the contact resonance frequencies of standard cantilevers used in Atomic Force Microscopy. The Young's modulus of nanocrystalline ferrite films have been measured as a function of oxidation temperature. Furthermore images showing the domain structure of piezoelectric lead zirconate titanate ceramics have been taken.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 591 , 1999 , 183
Copyright
Copyright © Materials Research Society 2000

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References

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