Published online by Cambridge University Press: 21 February 2011
Poly(l,4-phenylene)-bridged and poly(1,6-hexylene)-bridged silsesquioxanes(PPS and HPS) were prepared by the sol-gel process. The surface areas andpore diameters of these porous xerogels were obtained by BET and BJHmethods, respectively. These porous materials were used as a confinementmatrix for the growth of small-sized semiconductor and transition metalclusters. Quantum-sized CdS particles in PPS (approximately 58+12 Â) and HPS(91+16 Â) matrices were prepared by first soaking the xerogel in a CdCl2 solution. Following a washing with water, a Na2Ssolution was then added. EDAX and electron diffraction techniques were usedto identify the CdS particles. The particle sizes of CdS in PPS and HPS weredetermined by both UV measurements and from TEM images. Small-sized Crclusters were prepared in dried xerogels by an internal doping method. MixedCr/CdS phases were also prepared by internal loading of a chromium metalprecursor. Following deposition of CdS the xerogel was heated at 120 °Cunder high vacuum, resulting in formation of intimately mixed phases of Crmetal and CdS. Changes in morphology, in particular the surface area andpore size distribution were noted. A decrease in surface area and anincrease in pore size were observed as a result of Cr metal deposition.