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Published online by Cambridge University Press: 10 February 2011
We fabricated SiO2/Au nanocomposites using alternate sputtering method. The size of the Au particles seem was unchanged by the SiO2 sputtering and well controllable by the sputtering parameters. The nanoparticles in SiO2 were observed by TEM and the nanocomposites were characterized using XPS technique. TEM observation revealed the size of Au nanoparticles to be 2–15 nm. We observed a chemical shift of the Au4f peak in the XPS study. We demonstrate the efficiency of the technique for controlling the size and quantity of nanoparticles dispersed in nanocomposites.