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Published online by Cambridge University Press: 21 February 2011
A mass spectrometry method (Electrospray Mass Spectrometry [ESMS]) for analyzing organometallic precursors of nano-materials is described. We show that application of low-cone voltage ESMS is a useful technique for the rapid analysis of intact organometallic precursor molecules when both positive and negative ionic modes are analyzed. This method shows promise for extrapolation to analysis of the dynamics of growth in nano-scale materials.