Crossref Citations
This article has been cited by the following publications. This list is generated based on data provided by
Crossref.
Kennedy, T. A.
Glaser, E. R.
Freitas, J. A.
Carlos, W. E.
Khan, M. Asif
and
Wickenden, D. K.
1995.
Native defects and dopants in gan studied through photoluminescence and optically detected magnetic resonance.
Journal of Electronic Materials,
Vol. 24,
Issue. 4,
p.
219.
Van de Walle, Chris G
and
Neugebauer, Jörg
1996.
Theory of Point Defects and Interfaces.
MRS Proceedings,
Vol. 449,
Issue. ,
Neugebauer, Jörg
and
Van de wallei, Chris G.
1996.
Role Of Hydrogen And Hydrogen Complexes In Doping Of Gan.
MRS Proceedings,
Vol. 423,
Issue. ,
Gorczyca, I.
Svane, A.
and
Christensen, N. E.
1997.
Theoretical study of point defects in GaN and AlN; lattice relaxations and pressure effects.
MRS Internet Journal of Nitride Semiconductor Research,
Vol. 2,
Issue. ,
Stumm, Petra
and
Drabold, D. A.
1997.
Structure, Electronic Properties, Defects and Doping of AlN Using a Self-Consistent Molecular Dynamics Method.
MRS Proceedings,
Vol. 468,
Issue. ,
Zapol, Peter
Pandey, Ravindra
and
Gale, Julian D
1997.
An interatomic potential study of the properties of gallium nitride.
Journal of Physics: Condensed Matter,
Vol. 9,
Issue. 44,
p.
9517.
Neugebauer, Jörg
Zywietz, Tosja
Scheffler, Matthias
Northrup, John E.
and
Van de Walle, Chris G.
1998.
Clean and As-Covered Zinc-Blende GaN (001) Surfaces: Novel Surface Structures and Surfactant Behavior.
Physical Review Letters,
Vol. 80,
Issue. 14,
p.
3097.
Stampfl, C.
and
Van de Walle, Chris G.
1998.
Doping of AlxGa1−xN.
Applied Physics Letters,
Vol. 72,
Issue. 4,
p.
459.
Ambacher, O
1998.
Growth and applications of Group III-nitrides.
Journal of Physics D: Applied Physics,
Vol. 31,
Issue. 20,
p.
2653.
Van de Walle, Chris G
Stampfl, Catherine
and
Neugebauer, Jörg
1998.
Theory of doping and defects in III–V nitrides.
Journal of Crystal Growth,
Vol. 189-190,
Issue. ,
p.
505.
Neugebauer, Jörg
and
Van De Walle, Chris G.
1999.
Vol. 61,
Issue. ,
p.
479.
Jin, Young-Gu
Jeong, J.-W
and
Chang, K.J
1999.
Real-space electronic structure calculations of charged clusters and defects in semiconductors using a multigrid method.
Physica B: Condensed Matter,
Vol. 273-274,
Issue. ,
p.
1003.
Jain, S. C.
Willander, M.
Narayan, J.
and
Overstraeten, R. Van
2000.
III–nitrides: Growth, characterization, and properties.
Journal of Applied Physics,
Vol. 87,
Issue. 3,
p.
965.
Doppalapudi, Dharanipal
and
D. Moustakas, Theodore
2002.
Handbook of Thin Films.
p.
57.
Rickert, K. A.
Ellis, A. B.
Himpsel, F. J.
Sun, Jingxi
and
Kuech, T. F.
2002.
n-
GaN
surface treatments for metal contacts studied via x-ray photoemission spectroscopy.
Applied Physics Letters,
Vol. 80,
Issue. 2,
p.
204.
Yang, J.H.
and
Zsebök, O.
2004.
Effects of buffer layer and nitrogen purification on optical properties of MBE-grown GaN on sapphire(0001).
Thin Solid Films,
Vol. 466,
Issue. 1-2,
p.
21.
Van de Walle, Chris G.
and
Neugebauer, Jörg
2004.
First-principles calculations for defects and impurities: Applications to III-nitrides.
Journal of Applied Physics,
Vol. 95,
Issue. 8,
p.
3851.
Aouas, M.R
Sekkal, W
and
Zaoui, A
2004.
Lattice dynamics behavior in GaN doped with Mg, As, Si, and C.
Materials Chemistry and Physics,
Vol. 83,
Issue. 1,
p.
48.
Myers, S. M.
Wright, A. F.
Sanati, M.
and
Estreicher, S. K.
2006.
Theoretical properties of the N vacancy in p-type GaN(Mg,H) at elevated temperatures.
Journal of Applied Physics,
Vol. 99,
Issue. 11,
2008.
Handbook of Nitride Semiconductors and Devices.
p.
817.