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Micrometer-scale machining of metals and polymers enabled by focused ion beam sputtering

Published online by Cambridge University Press:  10 February 2011

D. P. Adams ,
G. L. Benavides  and
M. J. vasile
D. P. Adams
Affiliation:
Sandia National Laboratories, Albuquerque, NM 87185, dpadams@sandia.gov
G. L. Benavides
Affiliation:
Sandia National Laboratories, Albuquerque, NM 87185, dpadams@sandia.gov
M. J. vasile
Affiliation:
Louisiana Tech University, Ruston, LA 71272
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Abstract

This work combines focused ion beam sputtering and ultra-precision machining for microfabrication of metal alloys and polymers. Specifically, micro-end mills are made by Ga ion beam sputtering of a cylindrical tool shank. Using an ion energy of 20keV, the focused beam defines the tool cutting edges that have submicrometer radii of curvature. We demonstrate 25μm diameter micromilling tools having 2, 4 and 5 cutting edges. These tools fabricate fine channels, 26–28 microns wide, in 6061 aluminum, brass, and polymethyl methacrylate. Micro-tools are structurally robust and operate for more than 5 hours without fracture.

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