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Meyer-Neldel Rule in Deep-Level-Transient-Spectroscopy and its Ramifications

Published online by Cambridge University Press:  01 February 2011

Richard S. Crandall
Richard S. Crandall*
Affiliation:
National Renewable Energy Laboratory, Golden, Colorado 80401
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Abstract

This paper presents data showing a Meyer-Neldel rule (MNR) in InGaAsN alloys. It is shown that without this knowledge, significant errors will be made using Deep-Level Transient-Spectroscopy (DLTS) emission data to determine capture cross sections. By correctly accounting for the MNR in analyzing the DLTS data the correct value of the cross section is obtained.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 763: Symposium B – Compound Semiconductor Photovoltaics , 2003 , B2.5
Copyright
Copyright © Materials Research Society 2003

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