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Mechanical Performance of Thin Films in Flexible Displays

Published online by Cambridge University Press:  17 March 2011

Jay Lewis ,
Sonia Grego ,
Erik Vick ,
Babu Chalamala  and
Dorota Temple
Jay Lewis
Affiliation:
MCNC Research & Development Institute Research Triangle Park, NC 27709, U.S.A.
Sonia Grego
Affiliation:
MCNC Research & Development Institute Research Triangle Park, NC 27709, U.S.A.
Erik Vick
Affiliation:
MCNC Research & Development Institute Research Triangle Park, NC 27709, U.S.A.
Babu Chalamala
Affiliation:
MCNC Research & Development Institute Research Triangle Park, NC 27709, U.S.A.
Dorota Temple
Affiliation:
MCNC Research & Development Institute Research Triangle Park, NC 27709, U.S.A.
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Abstract

The use of brittle materials in flexible displays requires the understanding of the mechanical limitations of the materials and the various display architectures. We discuss various approaches to mechanical bend tests for components of flexible displays and describe a new test method based on a three-axis motion. We discuss the mechanical limitations of indium tin oxide (ITO) as a transparent conductor, and present results for a more mechanically robust multilayer transparent conductor made of an ITO-metal-ITO (IMI) stack. The IMI structures showed dramatically improved mechanical properties when subjected to bending both as a function of radius of curvature as well as number of cycles to a fixed radius. Organic light emitting devices fabricated on IMI anodes showed improved performance compared with those made on ITO anodes at current densities greater than 1 mA/cm2 due to the improved conductivity of the anode. We discuss the difficulties in analysis of the mechanical failure of transparent thin film permeation barriers. We present a novel approach for etching barrier-coated polymer substrates such that film cracking is readily visible. We report on the bend test results for sputter- deposited SiOxNy films.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 814: Symposium I – Flexible Electronics 2004-Materials and Device Technology , 2004 , I8.5
Copyright
Copyright © Materials Research Society 2004

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References

1. Gu, G., Burrows, P. E., Venkatesh, S., Forrest, S. R. andThompson, M. E., Opt. Lett. 22, 172–174 (1997).Google Scholar
2. Gustaffson, G., Treacy, G. M., Cao, Y., Klavetter, F., Colaneri, N. andHeeger, A. J., Synth. Met. 55–57, 4123–4127 (1993).Google Scholar
3. Yoshida, A., Sugimoto, A., Miyadera, T. andMiyaguchi, S., J. Photopolymer Sci. and Technol. 14, 327–332 (2001).Google Scholar
4. Yoshida, A., Fujimura, S., Miyake, T., Yoshizawa, T., Ochi, H., Sugimoto, A., Kubota, H., Miyadera, T., Ishizuka, S., Tsuchida, M. andNakada, H., Proceedings of the Society for Information Display Symposium, Digest of Technical Papers 34, 856–859 (2003).Google Scholar
5. Utsunomiya, S., Kamakura, T., Kasuga, M., Kimura, M., Miyazawa, W., Inoue, S. andShimoda, T., Proceedings of the Society for Information Display Symposium, Digest of Technical Papers 34, 864–867 (2003).Google Scholar
6. Chwang, A. B., Rothman, M. A., Mao, S. Y., Hewitt, R. H., Weaver, M. S., Silvernail, J. A., Rajan, K., Hack, M., Brown, J. J., Chu, X., Moro, L., Krajewski, T. andRutherford, N., Appl. Phys. Lett. 83, 413–415 (2003).Google Scholar
7. Chwang, A. B., Rothman, M. A., Mao, S. Y., Hewitt, R. H., Weaver, M. S., Silvernail, J. A., Rajan, K., Hack, M., Brown, J. J., Chu, X., Moro, L., Krajewski, T. andRutherford, N., Proceedings of the Society for Information Display Symposium, Digest of Technical Papers 34, 868–871 (2003).Google Scholar
8. Gleskova, H., Wagner, S. andSuo, Z., Appl Phys Lett 75, 3011 (1999).Google Scholar
9. Cairns, D. R., , R.P.W. II, Sparacin, D. K., Sachsman, S. M., Paine, D. C. andCrawford, G. P., Appl Phys Lett 76, 1425–1427 (2000).Google Scholar
10. Yanaka, M., Henry, B. M., Roberts, A. P., Grovenor, C.R. M., Briggs, G.A. D., Sutton, A. P., Miyamoto, T., Tsukahara, Y., Takeda, N. andChater, R. J., Thin Solid Films 397, 176–185 (2001).Google Scholar
11. Kater, T., Philip Research Report 2002/812 (2002).Google Scholar
12. Nuesch, F., Forsythe, E. W., Le, Q. T., Gao, Y. andRothberg, L. J., J Appl Phys 87, 7973–7980 (2000).Google Scholar
13. Le, Q. T., Nuesch, F., Rothberg, L. J., Forsythe, E. W. andGao, Y., Appl Phys Lett 75, 1357–1359 (1999).Google Scholar
14. Mason, M. G., Hung, L. S., Tang, C. W., Lee, S. T., Wong, K. W. andWang, M., J Appl Phys 86, 1688–1692 (1999).Google Scholar
15. Park, S. K., Han, J. I., Moon, D. G. andKim, W. K., Jpn. J. Appl. Phys. 42, 624–629 (2003).Google Scholar
16. Liu, X., Cai, X., Qiao, J., Mao, J. andJiang, N., Thin Solid Films 441, 200–206 (2003).Google Scholar
17. Liu, X., Cai, X., Mao, J. andJin, C., Applied Surface Science 183, 103–110 (2001).Google Scholar
18. Fan, J.C. C., Bachner, F. J., Foley, H. andZavracky, P. M., Appl. Phys. Lett. 25, 693–695 (1974).Google Scholar
19. Nadel, S. J., J. Vac. Sci. Technol. A 5, 2709–2713 (1987).Google Scholar
20. Finley, J. J., J. Vac. Sci. Technol. A 14, 739–746 (1996).Google Scholar
21. Ohsaki, H. andTachibana, Y., Thin Solid Films 442, 153–157 (2003).Google Scholar
22. Kusano, E., Kawaguchi, J. andEnjouji, K., J. Vac. Sci. Technol. A 4, 2907–2910 (1986).Google Scholar
23. Tachibana, Y., Kusunoki, K., Watanabe, T., Hashimoto, K. andOhsaki, H., Thin Solid Films 442, 212–216 (2003).Google Scholar
24. Fahland, M., Karlsson, P. andCharton, C., in 3rd International Conference on Coatings on Glass, Maastricht, NL, 2000, p. 689–694.Google Scholar
25. Bender, M., Seelig, W., Daube, C., Frankenberger, H., Ocker, B. andStollenwerk, J., Thin Solid Films 326, 67–71 (1998).Google Scholar
26. Aoshima, Y., Miyazaki, M., Sato, K., Akao, Y., Takaki, S. andAdachi, K., Jpn. J. Appl. Phys. 39, 4884–4889 (2000).Google Scholar
27. Choi, K. H., Kim, J. Y., Lee, Y. S. andKim, H. J., Thin Solid Films 341, 152–155 (1999).Google Scholar
28. Lewis, J., Grego, S., Chalamala, B., Vick, E. andTemple, D., Submitted for publication (2004).Google Scholar
29. Leftheriotis, G., Yianoulis, P. andPatrikios, D., Thin Solid Films 306, 92–99 (1997).Google Scholar
30. Lewis, J., Grego, S., Chalamala, B., Vick, E. andTemple, D., 47th Annual Society of Vacuum Coaters Technical Conference Proceedings (2004).Google Scholar
31. Allen, K., in Information Display (2002), p. 26–28.Google Scholar
32. Lewis, J. andWeaver, M., IEEE Journal of Selected Topics in Quantum Electronics, in press (2004).Google Scholar
33. Rochat, G., Leterrier, Y., Fayet, P. and Manson, J.-A.E., Thin Solid Films 437, 204–210 (2003).Google Scholar
34. Sobrinho, A. S. da Silva, Czeremuszkin, G., Latreche, M. andWertheimer, M. R., Mat. Res. Soc. Symp. Proc. 544, 245–250 (1999).Google Scholar