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Magnetic and 119-Sn Mössbauer Effect Study of Sn-Doped Pb2Sr2Eu.5Cu3-xSnxO8+z (x = 0.0, 0.1) Superconductors*

Published online by Cambridge University Press:  28 February 2011

P. P. Vaishnava ,
C. D. Nelson  and
W. P. Pratt Jr.
P. P. Vaishnava
Affiliation:
GMI Engineering & Management Institute, Flint, MI 48504
C. D. Nelson
Affiliation:
Department of Physics and Astronomy, Michigan State University, East Lansing, MI 48824
W. P. Pratt Jr.
Affiliation:
Department of Physics and Astronomy, Michigan State University, East Lansing, MI 48824
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Abstract

X-ray diffraction, magnetic susceptibility and 119-Sn Mössbauer effect measurements have been performed on Pb2Sr2Eu.5Cu3-xSnx08+z (x = 0.0, 0.1) superconductors. The x-ray diffraction pattern indicated that the samples are single phase materials. The diamagnetic shielding and the Meissner fraction increase with the introduction of Sn in the lattice. The 119-Sn Mössbauer effect measurements have been used to determine the site symmetry and valence state of Sn atom in the superconductor.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 169: Symposium M – High Temperature Superconductors: Fundamental Properties and Novel Materials Processing , 1989 , 1021
Copyright
Copyright © Materials Research Society 1990

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Footnotes

*

Work supported by Center for Fundamental Material Research, Michigan State University, East Lansing, MI 48824

References

1 Cava, R. J., Batlogg, B., Krajewski, J. J., Rupp, L. W., Schneemeyer, L. F., Siegrist, T., van Dover, R. B., Marsh, P., Peck, W. F. Jr., Gallagher, P. K., Glarum, S. H., Marshall, J. F., Farrow, R. C., Waszczak, J. V., Hull, R., and Trevor, P., Nature, 336, 211 (1988).Google Scholar
2 Cava, R. J., Marezio, M., Krajewski, J. J., Santoro, A., Peck, W. F. Jr., and Beech, F., Physica C 157, 272 (1989).Google Scholar
3 Hull, R., Bonar, J. M., Schneemeyer, L. F., Cava, R. J., Krajewski, J. J., and Waszczak, J. V., Phys. Rev. B 39, 9685 (1989).Google Scholar
4 Subramanian, M. A., Gopalakrishnan, J., Torardi, C. C., Gai, P. L., Boyes, E. D., Askew, T. R., Flippen, R. B., Farneth, W. E., and Sleight, A. W., Physica C 157, 124 (1989).Google Scholar
5 Rao, C. N. R., Bhat, V., Nagarajan, R., Ranga Rao, G., and Sankar, G., Phys. Rev. B 39, 9621 (1989).Google Scholar
6 Dwight, A. E., Vaishnava, P. P., Kimball, C. W., and Matykiewicz, J. L., J. Less Comm. Met. 119, 319 (1986).Google Scholar
7 Booichand, P., Enzweiler, R. N., Zitkovsky, I., Wells, J., Bresser, W., McDaniel, D., Meng, R. L., Hor, P. H., Chu, C. W., Huang, C. Y., Phys. Rev. B 37, 3766 (1988).Google Scholar