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Long-Range Coherency Strain and Tilted Ipitaxy in Ag-Fe-Ag Sandwich Structures on Gaas(001) Substrates

Published online by Cambridge University Press:  22 February 2011

R. F. C. Farrow ,
V. S. Speriosu ,
S. S. P. Parkin ,
C. Chien ,
J. C. Bravman ,
R. F. Marks ,
P. D. Kirchner ,
G. A. Prinz  and
B. T. Jonker
R. F. C. Farrow
Affiliation:
IBM Almaden Research Center, San Jose, Ca. 95120.
V. S. Speriosu
Affiliation:
IBM Almaden Research Center, San Jose, Ca. 95120.
S. S. P. Parkin
Affiliation:
IBM Almaden Research Center, San Jose, Ca. 95120.
C. Chien
Affiliation:
Stanford University, Department of Materials Science and Engineering, Stanford, Ca.94305.
J. C. Bravman
Affiliation:
Stanford University, Department of Materials Science and Engineering, Stanford, Ca.94305.
R. F. Marks
Affiliation:
IBM Thomas J. Watson Research Center, Yorktown Heights, N.Y. 10598.
P. D. Kirchner
Affiliation:
IBM Thomas J. Watson Research Center, Yorktown Heights, N.Y. 10598.
G. A. Prinz
Affiliation:
Naval Research Laboratory, Washington, DC 20375.
B. T. Jonker
Affiliation:
Naval Research Laboratory, Washington, DC 20375.
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Abstract

We find that epitaxial Fe films sandwiched between epitaxial Ag films grown on GaAs (001) substrates possess residual coherency strain at a thickness of 2000Å. The [001] directions of the Fe and Ag films are tilted with respect to the GaAs [001] axis. The tilts are coplanar with the tilt of the substrate surface normal to the [001] axis of GaAs and are qualitatively consistent with a recently proposed modol for tilted epitaxy.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 130: Symposium C – Thin Films: Stresses and Mechanical Properties I , 1988 , 281
Copyright
Copyright © Materials Research Society 1989

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References

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