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Is it a Right Assumption That B and Ge are Distributed Randomly After Growing a Strained HBT-Structure?

Published online by Cambridge University Press:  01 February 2011

Victor I. Kol'dyaev
Victor I. Kol'dyaev*
Affiliation:
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Abstract

It is accepted that surface Ge atoms are considered to be responsible for the surface B segregation process. A set of original experiments is carried out. A main observation from the B and Ge profiles grown at different conditions shows that at certain conditions B is taking initiative and determine the Ge surface segregation process. basic assumptions are suggested to self-consistently explain these original experimental features and what is observed in the literature. These results have a strong implication for modeling the B diffusion in Si1-xGex where the initial conditions should be formulated accounting for the correlation in B and Ge distribution. A new assumption for the initial condition to be “all B atoms are captured by Ge ” is regarded as a right one implicating that there is no any transient diffusion representing the B capturing kinetics.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 716: Symposium B – Silicon Materials-Processing, Characterization, and Reliability , 2002 , B4.7
Copyright
Copyright © Materials Research Society 2002

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