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Interface Structure in Ferritic/Austenitic Stainless Steel Bicrystals

Published online by Cambridge University Press:  21 March 2011

Aude Taisne ,
Brigitte Décamps  and
Louisette Priester
Aude Taisne
Affiliation:
Laboratoire de Chimie Métallurgique des Terres Rares, UPR 209 du CNRS, Groupe des Laboratoires de Vitry-Thiais, 2-8 rue Henri Dunant, 94320 Thiais cedex, France
Brigitte Décamps
Affiliation:
Laboratoire de Chimie Métallurgique des Terres Rares, UPR 209 du CNRS, Groupe des Laboratoires de Vitry-Thiais, 2-8 rue Henri Dunant, 94320 Thiais cedex, France
Louisette Priester
Affiliation:
Laboratoire d'Etudes des Matériaux Hors Equilibre, UMR 8647, Université Paris-Sud, 91405 Orsay cedex, France
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Abstract

Elementary mechanisms of deformation by fatigue in duplex stainless steels bicrystals are studied by transmission electron microscopy (TEM). An attempt is made to correlate the bicrystal macroscopic behaviour with the interphase interface crystallography.

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References

REFERENCES

1. Wada, T., Hashimoto, S., Fatigue Crack Growth across the interphase boundaries in two-phase bicrystals, Materials Science Forum, 294–296, 693–696 (1999).Google Scholar
2. Rys, J., Wada, T., Hashimoto, S. and Miura, S., Deformation behaviour of stainless steel (αγ) two-phase bicrystals, Archives of Metallurgy, 38, Issue 2, 255–274 (1993).Google Scholar
3. Rys, J., Interpretation of slip behaviour adjacent to (α/γ) phase interfaces at the onset of yielding, Inzynieria Materialowa, NR 3, 209–214 (1998).Google Scholar
4. Head, A. K., Humble, P., Clarebrough, L.M., Morton, A.J., Forwood, C. T., Computer Electron Micrographs and Defect Identification, Amsterdam : North-Holland (1973).Google Scholar