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References
1
1Bednorz, J.G. and Mueller, K.A., Z. Phys., B64,189 (1986).Google Scholar
6Schrott, A.G., Cohen, S.L., Dinger, T.R., Himpsel, F.J., Yarmoff, J.A., Frase, K.G., Park, S.I., Purtell, R., in Thin Film Processing and Characterization of High‐Temperature Superconductors, ed. by Harper, J.M.E., Colton, R.J., and Feldman, L.C., AIP Conference Proceedings165, 349 (1988).Google Scholar
7
7Greenlief, C.M., Bringley, J.F., Scott, B.A., Gates, S.M., Trail, S.S., and D'Emic, C., Chem. of Materials, to be submitted.Google Scholar