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InAsSb Photodiodes Grown on InAs, GaAs and Si Substrates by Molecular Beam Epitaxy

Published online by Cambridge University Press:  25 February 2011

W. Dobbelaere ,
J. De Boeck ,
W. De Raedt ,
J. Vanhellemont ,
G. Zou ,
M. Van Hove ,
B. Brijs ,
R. Mertens  and
G. Borghs
W. Dobbelaere
Affiliation:
Interuniversity Micro-Electronics Center (IMEC vzw), 75 Kapeldreef, B-3001 Leuven, BELGIUM
J. De Boeck
Affiliation:
Interuniversity Micro-Electronics Center (IMEC vzw), 75 Kapeldreef, B-3001 Leuven, BELGIUM
W. De Raedt
Affiliation:
Interuniversity Micro-Electronics Center (IMEC vzw), 75 Kapeldreef, B-3001 Leuven, BELGIUM
J. Vanhellemont
Affiliation:
Interuniversity Micro-Electronics Center (IMEC vzw), 75 Kapeldreef, B-3001 Leuven, BELGIUM
G. Zou
Affiliation:
Interuniversity Micro-Electronics Center (IMEC vzw), 75 Kapeldreef, B-3001 Leuven, BELGIUM
M. Van Hove
Affiliation:
Interuniversity Micro-Electronics Center (IMEC vzw), 75 Kapeldreef, B-3001 Leuven, BELGIUM
B. Brijs
Affiliation:
Interuniversity Micro-Electronics Center (IMEC vzw), 75 Kapeldreef, B-3001 Leuven, BELGIUM
R. Mertens
Affiliation:
Interuniversity Micro-Electronics Center (IMEC vzw), 75 Kapeldreef, B-3001 Leuven, BELGIUM
G. Borghs
Affiliation:
Interuniversity Micro-Electronics Center (IMEC vzw), 75 Kapeldreef, B-3001 Leuven, BELGIUM
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Abstract

InAs and InAs0.85Sb0.15p-“i”-n structures were grown on InAs, GaAs and Si substrates by Molecular Beam Epitaxy. The structural quality of the layers is discussed using Transmission Electron Microscopy and Rutherford Back Scattering. The influence of the material quality on the 77 K current-voltage measurements is explained. The spectral response of the devices was measured demonstrating peak responsivities of 2.1 A/W at 3.5μm wavelength for InAs0.85Sb0.15 detectors with a 4.3 μm cut-off wavelength.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 216: Symposium T – Long-Wavelength Semiconductor Devices, Materials and Processes , 1990 , 181
Copyright
Copyright © Materials Research Society 1991

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References

REFERENCES

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