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Impact of Erbium-Doped Silicon Nanocrystals on the Properties of Polyphenylene Vinylene Films

Published online by Cambridge University Press:  17 March 2011

Jeffery L. Coffer  and
Junmin Ji
Jeffery L. Coffer
Affiliation:
Department of Chemistry Texas Christian University, Ft. Worth, Texas 76129, e-mail: j.coffer@tcu.edu
Junmin Ji
Affiliation:
Department of Chemistry Texas Christian University, Ft. Worth, Texas 76129
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Abstract

This work describes our initial studies of Er-doped Si nanocrystal/poly(phenylene vinylene) (PPV) composites. Preliminary results have focused on the characterization of these materials via atomic force microscopy (AFM), profilometry, absorption/fluorescence spectroscopies, and current-voltage measurements. A particular point of emphasis here concerns the influence of the Er-doped Si nanocrystals on PPV photoluminescence and carrier transport.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 638: Symposium F – Microcrystaline & Nanocrystalline Semiconductors-2000 , 2000 , F14.29.1
Copyright
Copyright © Materials Research Society 2001

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