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References
1
1Sayre, D., Kirz, J., Feder, R., Kim, D.M., Spiller, E., Ultramicroscopy2, 337 (1977).CrossRefGoogle Scholar
2
2Cheng, P.C., Shinozaki, D.M., Tan, K.H., in X-ray Microscopy: Instrumentation and Biological Applications, edited by Cheng, P.C. and Jan, G.J. (Springer-Verlag, Berlin, 1987), p. 65.CrossRefGoogle Scholar
3
3Schmahl, G., Rudolph, D., X-ray Microscopy, (Springer-Verlag, Berlin, 1984).Google Scholar
4
4Sayre, D., Howells, M., Kirz, J., Rarback, H., X-ray Microscopy II, (Springer-Verlag, Berlin, 1988).CrossRefGoogle Scholar
9Hoffman, A. L, Albrecht, F.F., Crawford, E.A., Rose, P.H., Proc. SPIE537, 198 (1985).CrossRefGoogle Scholar
10
10Nagel, D.J., Brown, C., Peckarar, M., Ginter, M.L., Robinson, J., T.J. McIlrath, Appl Opt.23, 1428 (1984).Google Scholar
11
11Damerell, A., Madraszek, E., O'Neill, F., Rizvi, N., Rosser, R., Rumsby, P., in X-ray Microscopy II, edited by Sayre, D., Howells, M., Kirz, J., Rarback, H., (Springer-Verlag, Berlin, 1988), p. 43.Google Scholar
12
12Trebes, J., Brown, S., Campbell, E.M., Ceglio, N.M., Eder, D., Gaines, D., Hawryluk, A., Keane, C., London, R., McGowan, B., Mathews, D., Maxon, S., Nilson, D., Rosen, M., Stearns, D., Stone, G., Whelan, D., X-ray Microscopy II, p. 30.Google Scholar
14Neff, W., Eberle, J., Holz, R., Richter, R., Lebert, R. in X-ray Microscopy II, edited by Sayre, D., Howells, M., Kirz, J., Rarback, H. (Springer- Verlag, Berlin, 1988), p. 22.CrossRefGoogle Scholar
15
15Rarback, H., Shu, D., Feng, Su Cheng, Ade, H., Jacobsen, C., Kirz, J., McNulty, I., Vladimirsky, Y., Kern, D., Chang, P., in X-ray Microscopy II, edited by Sayre, D., Howells, M., Kirz, J., Rarback, H. (Springer- Verlag, Berlin, 1988), p. 194.CrossRefGoogle Scholar
16
16Morrison, G. R., Browne, M.T., Buckley, C.J., Burge, R.E., Cave, R.C., Charalambous, P., Duke, P.J., Hare, A.R., Hills, C.P.B., Kenney, J.M., Michette, A.G., Ogawa, K., Rogoyske, A.M., Taguchi, T., X-ray Microscopy II, edited by Sayre, D., Howells, M., Kirz, J., Rarback, H. (Springer- Verlag, Berlin, 1988) p. 201.CrossRefGoogle Scholar
17
17Niemann, B., Guttmann, P., Hilkenbach, R., Thieme, J., Meyer-Ilse, W., X-ray Microscopy II, edited by Sayre, D., Howells, M., Kirz, J., Rarback, H. (Springer- Verlag, Berlin, 1988), p. 209.Google Scholar
18
18Rarback, H., Shu, D., Feng, S.C., Ade, H., Kirz, J., McNulty, I., Kern, D.P., Chang, T.H.P., Vladimirsky, Y., Iskander, N., Attwood, D., McQuaid, K., Rothman, S., Rev. Sci. Instrum.59 (1), 52 (1988).Google Scholar
19
19Bogli, V., Unger, P., Beneking, H., Greinke, B., Guttmann, P., Niemann, B., Rudolph, D., Schmahl, G., in X-ray Microscopy II, edited by Sayre, D., Howells, M., Kirz, J., Rarback, H. (Springer-Verlag, Berlin, 1988), p. 80.CrossRefGoogle Scholar
20
20Buckley, C.J., Browne, M.T., Burge, R.E., Charalambous, P., Ogawa, K., Takeyoshi, T., X-ray Microscopy II, edited by Sayre, D., Howells, M., Kirz, J., Rarback, H. (Springer-Verlag, Berlin, 1988), p. 88.Google Scholar
21
21Schmahl, G., Rudolph, D., Guttmann, P., Christ, O in X-ray Microscopy, edited by Schmahl, G., Rudolph, D. (Springer-Verlag, Berlin, 1984), p. 63.CrossRefGoogle Scholar
22
22Michette, A.G., Optical Systems for Soft X-rays (Plenum Press, New York, 1986).Google Scholar
23
23Niemann, B., Rudolph, D., Schmahl, G.Proc. SPIE368, 2 (1982).Google Scholar
24
24Niemann, B., Rudolph, D., Schmahl, G.Nucl. Instru. Meth. in Phys. Res. A208, 367 (1983).Google Scholar
25
25Spiller, E. in Handbook on Synchrotron Radiation 18, edited by Koch, E.E. (North Holland, New York, 1983), p.1091.Google Scholar
26
26Spiller, E. in X-ray Microscopy, edited by Schmahl, G., Rudolph, D. (Springer-Verlag, Berlin, 1984), p. 226.Google Scholar
27
27Cerrina, F., J. Imaging Science30 (2), 80 (1986).Google Scholar
28
28Shinozaki, D.M., Robertson, B.W. in X-ray Microscopy: Instrumentation and Biological Applications, edited by Cheng, P.C., Jan, G.J. (Springer- Verlag, Berlin, 1987) p. 105.Google Scholar
29
29Shinozaki, D.M., Feder, R., Treatise on Materials Sc. and Technol.27 (1988), 111.CrossRefGoogle Scholar
30
30Schmahl, G., Rudolph, D., Guttman, P. in X-ray Microscopy II, edited by Sayre, D., Howells, M., Kirz, J., Rarback, H. (Springer-Verlag, Berlin, 1988), p. 228.Google Scholar
31
31Howells, M., in X-ray Microscopy II, edited by Sayre, D., Howells, M., Kirz, J., Rarback, H. (Springer-Verlag, Berlin, 1988), p. 263.Google Scholar
32
32Sayre, D., Yun, W.B., Kirz, J., in X-ray Microscopy II, edited by Sayre, D., Howells, M., Kirz, J., Rarback, H. (Springer-Verlag, Berlin, 1988), p. 272.Google Scholar
33
33Yun, W.B., Kirz, J., Acta Crysta.A43 (1987), p. 133.Google Scholar
34
34Ade, H., Kirz, J., Rarback, H., Hulbert, S., Johnson, E., Kern, D., Chang, P., Vladimirsky, V., in X-ray Microscopy II, edited by Sayre, D., Howells, M., Kirz, J., Rarback, H. (Springer-Verlag, Berlin, 1988), p. 280.Google Scholar