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Image Simulations of Ge Twin Boundaries.

Published online by Cambridge University Press:  15 February 2011

Stuart Mckernan  and
C. Barry Carter
Stuart Mckernan
Affiliation:
Department of Chemical Engineering and Materials Science, University of Minnesota, Minneapolis, MN 55455.
C. Barry Carter
Affiliation:
Department of Chemical Engineering and Materials Science, University of Minnesota, Minneapolis, MN 55455.
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Abstract

General high-angle tilt grain boundaries may be described by an arrangement of repeating structural units. Some grain-boundary defects may also be modeled by the incorporation of structural units of related boundary structures into the boundary. The simulation of these structures requires the use of prohibitively large unit cells. The possibility of modeling these boundaries by the superposition of image simulations of the individual structural units isinvestigated.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 295: Symposium W – Atomic-Scale Imaging of Surfaces and Interfaces , 1992 , 173
Copyright
Copyright © Materials Research Society 1993

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References

1. Elgat, Z.; PhD Thesis, Cornell University, (1985)Google Scholar
2. Elgat, Z., and Carter, C.B.; Ultramicroscopy, 18, 313, (1985)Google Scholar
3. Smith, D.A., Elgat, Z., Krakow, W., Levi, A.A. and Carter, C.B.; Ultramicroscopy, 30, 8, (1989)Google Scholar
4. McKernan, S., Carter, C.B., and Elgat, Z.; Mat. Res. Soc. Symp. Proc. 209, 637–642 (1991)Google Scholar
5. Skrotzki, W., Wendt, H., Carter, C.B.; and Kohlstedt, D.L.; Mat. Res. Soc. Symp. Proc. 25, 341, (1984)Google Scholar
6. Total Resolution, 20 Florida Ave., Berkeley, CA 94707Google Scholar
7. Stadelman, P.; Ultramicroscopy, 21, 131, (1987)Google Scholar
8. Rasmussen, D. R., McKernan, S., and Carter, C. B.; Proc. 47th EMSA, 130, (1989).Google Scholar