Published online by Cambridge University Press: 01 February 2011
In this study we examine the immediate interface between matrix grains and the amorphous intergranular film in a Si3N4 ceramic doped with rare-earth oxides La2O3, Sm2O3, Er2O3, Yb2O3 and Lu2O3, extracting unique structural and atomic bonding information. In particular, we relate the structure of the interface to the ionic size and electronic structure of the rare-earth elements and the presence of oxygen in the intergranular film. We relate these results to the measured fracture toughness.