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High-Resolution Electron Microscopy Studies of Co/Cr Multilayers

Published online by Cambridge University Press:  21 February 2011

Shu-Chen Y. Tsen ,
Mary Beth Stearns  and
David J. Smith
Shu-Chen Y. Tsen
Affiliation:
Department of Physics, Arizona State University, Tempe, AZ 85287
Mary Beth Stearns
Affiliation:
Department of Physics, Arizona State University, Tempe, AZ 85287
David J. Smith
Affiliation:
Department of Physics, Arizona State University, Tempe, AZ 85287
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Abstract

The growth characteristics of Co/Cr multilayers have been studied in cross-section with a 400kV high-resolution electron microscope. The growth directions for bcc Cr were predominantly <110> while the axes of the observed crystallite fringes were mainly <100> and <111>. The hcp Co crystallites grew predominantly in the <10.1> direction while the areas with strong fringes were along a <10.0> projection. This observed structure was in agreement with that obtained from analysis of large angle X-ray scattering spectra. The columnar structure was found to be present with the layers growing right through the columns.

Information

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 139: Symposium R – High Resolution Microscopy of Materials , 1989 , 217
Copyright
Copyright © Materials Research Society 1989

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References

REFERENCES

1. Stearns, M. B., Lee, C. H. and Vernon, S. P., J. Magn. Magn. Mater., 54–57, 791 (1986).CrossRefGoogle Scholar
2. Ramakrishna, B. L., Lee, C. H., Cheng, Y., and Stearns, M. B., J. Appl. Phys. 61, 4290 (1987).Google Scholar
3. Ge, Shihui and Stearns, M. B., J. Appl. Phys. 63, 4297 (1988).Google Scholar
4. Stearns, M. B., Phys. Rev. B 38, 8109 (1988).Google Scholar
5. Stearns, M. B., Lee, C. H. and-Groy, T. L., submitted to Physical Review B.Google Scholar
6. Saxton, W. O., Pitt, T. J. and Homer, M., Ultramicroscopy 4, 343 (1979).Google Scholar
7. Bravman, C. and Sinclair, R., J. Electron Microsc. Tech. 1, 53 (1984).CrossRefGoogle Scholar
8. Mackenzie, J. K., Moore, A. J. W. and Nicholas, J. F., J. Phys. Chem. Solid 23, 185 (1962).CrossRefGoogle Scholar