We present a study of the optoelectronic and structural properties of a-Si:H deposited by Hot-Wire chemical vapor deposition (HW-CVD) from SiH4 and H2 at “Medium” (Tfil ≃ 1500°C) and “high” (Tfil ≃ 1900 °C) filament temperatures. For each tungsten filament temperature regime, the following deposition parameters are varied: (i) pressure (p ∼ 10−2 — 0.5 Torr); (ii) substrate temperature (Tsub ∼ 180 — 270 °C); (iii) silane flow rate (FsiH4 ∼ 1 — 10 ccm) and (iv) hydrogen flow rate (FH2 ∼ 0 — 10 seem). Films deposited at Tfil ∼ 1900 °C in a low pressure regime (p ∼ 2.7 × 10−2Torr) using flows of 5 sccm for both H2 and SiH4 had high deposition rates (rd ∼ 8 Ås−1). These films showed an optical bandgap, E9Tauc ≃ 1.7 eV, a dark conductivity σd ∼ 10−8Scm−1 with an activation energy Eα,σd ≃ 0.8 eV, and photoconductivity σph ≥ 10−5Scm−1 (σph ∼ 10−5). Films deposited at Tju = 1500 °C and p ≃ 0.3 Torr, showed 1.7 < E9Tauc < 2 eV, 10−5 < σd < 10−3Scm−1, 0.2 < Eα,σ d < 0.5 eV and σph/Σd < 102. For the same Tfit and p ∼ 3 × 10−2 — 0.1 Torr, the films show 1.7 < E9Tauc < 2 eV, 10−3 < Σd < 10−1Scm−1 and σph/σd < 1. Films deposited using molybdenum and rhenium filaments at Tfil ≃ 1900 °C show E9Tauc ≃ 1.7 eV and σd ∼ σph ∼ 10−7Scm−1