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High Resolution Transmission Electron Microscopy of Defect Clusters in Aluminum During Electron and Ion Irradiation at Room Temperature

Published online by Cambridge University Press:  15 February 2011

Kazuo Furuya ,
Min Piao ,
Nobuhiro Ishikawa  and
Tetsuya Saito
Kazuo Furuya
Affiliation:
National Research Institute for Metals, 3-13 Sakura, Tsukuba, 305 Japan, furukaz@nrim.go.jp
Min Piao
Affiliation:
National Research Institute for Metals, 3-13 Sakura, Tsukuba, 305 Japan, furukaz@nrim.go.jp
Nobuhiro Ishikawa
Affiliation:
National Research Institute for Metals, 3-13 Sakura, Tsukuba, 305 Japan, furukaz@nrim.go.jp
Tetsuya Saito
Affiliation:
National Research Institute for Metals, 3-13 Sakura, Tsukuba, 305 Japan, furukaz@nrim.go.jp
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Abstract

Defect clusters in Al during electron and ion irradiation have been investigated using highresolution transmission electron microscopy (HRTEM). An ION/HVEM system which consists of a high-voltage TEM and ion implanters was used for in-situ observation of damage evolution under 1000 keV electrons and 15 keV He+ irradiation at room temperature. HRTEM of Al in [110] orientation showed many planar defects along { 111 } planes during electron irradiation, while a high density of small polyhedron-shaped cavities (He-bubbles) was observed in addition to the planar defects after He+ irradiation. Multi-slice image simulation of various models of dislocation loops indicated the planar defect as an interstitial-type Frank loop.

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Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 439: Symposium B – Microstructure Evolution During Irradiation , 1996 , 331
Copyright
Copyright © Materials Research Society 1997

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