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Published online by Cambridge University Press: 10 February 2011
Stacking faults at order interfaces in TiAl have been examined by HREM. In addition to very extensive OCISF formation, C-core dislocation complexes spread over two parallel { 111 } planes have been observed at order interfaces lying predominantly parallel to the original (0002)α, planes. Such C-cores, corresponding to 1/2<211] and 1/2<112] interfacial dislocations, have been observed with localised regions of both extrinsic and hexagonal stacking.